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1.School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology, Hefei 230009, China
2.Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, Hefei 230009, China
Published:10 March 2022,
Received:04 August 2021,
Revised:22 September 2020,
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常松涛,夏豪杰.时间延迟积分荧光显微成像平场校正技术[J].光学精密工程,2022,30(05):527-535.
CHANG Songtao,XIA Haojie.Flat field correction technique for time delay integration fluorescence microscopy imaging[J].Optics and Precision Engineering,2022,30(05):527-535.
常松涛,夏豪杰.时间延迟积分荧光显微成像平场校正技术[J].光学精密工程,2022,30(05):527-535. DOI: 10.37188/OPE.20223005.0527.
CHANG Songtao,XIA Haojie.Flat field correction technique for time delay integration fluorescence microscopy imaging[J].Optics and Precision Engineering,2022,30(05):527-535. DOI: 10.37188/OPE.20223005.0527.
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