您当前的位置:
首页 >
文章列表页 >
Measuring system for normal section parameters of ball screw raceway
Micro/Nano Technology and Fine Mechanics | 更新时间:2024-05-06
    • Measuring system for normal section parameters of ball screw raceway

    • Significant breakthroughs have been made in the field of normal cross-section detection of ball screw raceway. The expert team has established a ball screw raceway normal section measurement system based on optical micrometers. By designing a detection device and optimizing data processing algorithms, fast, accurate, and non-destructive testing of the normal section of the ball screw raceway has been achieved. This system not only improves detection accuracy, but also significantly enhances the stability and reliability of measurement results. Experimental verification shows that compared with the data provided by the manufacturer, the error of the normal cross-section parameters measured by the optimized detection system is significantly reduced, and the improvement rate is significant. This research achievement provides a powerful tool for accurate measurement of the normal cross-section of ball screw raceway, which is of great significance for improving product quality and promoting technological progress in related fields.
    • Optics and Precision Engineering   Vol. 32, Issue 7, Pages: 1011-1022(2024)
    • DOI:10.37188/OPE.20243207.1011    

      CLC: TP29;TH124;TH161.12
    • Received:16 November 2023

      Revised:12 December 2023

      Published:10 April 2024

    移动端阅览

  • WU Jian,OU Yi,ZHOU Changguang,et al.Measuring system for normal section parameters of ball screw raceway[J].Optics and Precision Engineering,2024,32(07):1011-1022. DOI: 10.37188/OPE.20243207.1011.

  •  
  •  

0

Views

655

下载量

0

CSCD

Alert me when the article has been cited
提交
Tools
Download
Export Citation
Share
Add to favorites
Add to my album

Related Articles

Temperature model of ball screw and its thermal error prediction under single heat
Temperature field model of ball screws used in servo systems
High-gain PID controller for nanometer positioning

Related Author

LI Xing-fei
DONG Cheng-jun
CHEN Cheng
WU Teng-fei
TAN Wen-bin
CHEN Cheng
QIU Zu-rong
LI Xing-fei

Related Institution

State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University
School of Mechanical Engineering, Tianjin University of Commerce
State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China
Precision Engineering Research Institute, Harbin Institute of Technology
Precision and Intelligent Laboratory, Tokyo Institute of Technology, Yokohama 226-8503, Japan
0