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High-precision measurement of Wolter-I mandrel for X-ray microscopy by using double confocal probes
Modern Applied Optics | 更新时间:2024-08-19
    • High-precision measurement of Wolter-I mandrel for X-ray microscopy by using double confocal probes

    • 在X射线显微镜领域,研究人员成功搭建了基于光谱共焦探针的离线检测装置,实现了Wolter型芯轴表面中低频轮廓的高精度测量,并通过校准测试过程,将误差降至23纳米,验证了检测方法的准确性。
    • Optics and Precision Engineering   Vol. 32, Issue 13, Pages: 2004-2016(2024)
    • DOI:10.37188/OPE.20243213.2004    

      CLC: TH74
    • Published:10 July 2024

      Received:22 January 2024

      Revised:15 March 2024

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  • XUE Chunan,YU Jun,SHENG Pengfeng,et al.High-precision measurement of Wolter-I mandrel for X-ray microscopy by using double confocal probes[J].Optics and Precision Engineering,2024,32(13):2004-2016. DOI: 10.37188/OPE.20243213.2004.

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