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1.Shenzhen Angell Technology Co., Ltd., Shenzhen 518000, China
2.School of Physics & Optoelectronic Engineering, Guangdong University of University, Guangzhou 510006, China
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蓝重洲,王宗朋,文敏儒.双层平板探测的双能成像检测系统[J].光学精密工程,
LAN Chong-zhou,WANG Zong-peng,WEN Min-ru.Dual energy imaging inspection system using dual layer flat panel detector[J].Optics and Precision Engineering,
蓝重洲,王宗朋,文敏儒.双层平板探测的双能成像检测系统[J].光学精密工程, DOI:10.37188/OPE.XXXXXXXX.0001
LAN Chong-zhou,WANG Zong-peng,WEN Min-ru.Dual energy imaging inspection system using dual layer flat panel detector[J].Optics and Precision Engineering, DOI:10.37188/OPE.XXXXXXXX.0001
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