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Dual energy imaging inspection system using dual layer flat panel detector
更新时间:2022-01-20
    • Dual energy imaging inspection system using dual layer flat panel detector

    • Optics and Precision Engineering   Pages: 1-8(2022)
    • DOI:10.37188/OPE.XXXXXXXX.0001    

      CLC: TH774;TP751.1

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  • LAN Chong-zhou,WANG Zong-peng,WEN Min-ru.Dual energy imaging inspection system using dual layer flat panel detector[J].Optics and Precision Engineering, DOI:10.37188/OPE.XXXXXXXX.0001

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