In order to acquire high resolution spectra in a wider spectral range
the echelle based spectrographs were researched. The general theories of the echelle gratings and the echelle spectrographs were introduced briefly
and the distinction between echelle spectrograph and common plane grating spectrograph was analyzed and compared. A high-resolution echelle spectrograph of Czerney-Turner(C-T) structure was designed by using principles of optical imaging and aberration
and its wavelength ranges were set to be 200-500 nm which were the most intensive ranges of atomic spectra. To simplify the calculation work
the aberration of 350 nm wavelength beam was eliminated.Furthermore
the incident beam was set to work at a quasi-Littrow angle to acquire high diffraction efficiency. As a cross-disperser
a catadioptric prism was used to separate the overlapped diffraction orders
therefore
a two-dimensional spectral surface was obtained by CCD. The optical system shows the merits of flat field and point-to-point imaging
and its resolution could be 2 000-15 000 in the whole wavelength ranges. This instrument is aimed to research on the absorption and emission spectra of atoms
and can improve its performance by replacing different detectors and adding peripheral circuits and software.
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references
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