Projected fringe profilometry for profile measurement of high reflective surface

JIANG Hong-zhi; ZHAO Hui-jie; LI Xu-dong; LI Dong

doi:10.3788/OPE.20101809.2002

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Projected fringe profilometry for profile measurement of high reflective surface

Article | 更新时间：2020-08-12

- Projected fringe profilometry for profile measurement of high reflective surface
- Optics and Precision Engineering Vol. 18, Issue 9, Pages: 2002-2008(2010)
- 作者机构：
  
  北京航空航天大学仪器科学与光电工程学院精密光机电一体化技术教育部重点实验室,北京 100191
- 作者简介：
- 基金信息：
- DOI：10.3788/OPE.20101809.2002
  CLC： TB92;O436.2
- Received：12 November 2009，
  
  Revised：10 December 2009，
  
  Published Online：29 September 2010，
  
  Published：20 September 2010
- 稿件说明：
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姜宏志, 赵慧洁, 李旭东, 李冬. 用于强反射表面形貌测量的投影栅相位法[J]. 光学精密工程, 2010,18(9): 2002-2008

JIANG Hong-zhi, ZHAO Hui-jie, LI Xu-dong, LI Dong. Projected fringe profilometry for profile measurement of high reflective surface[J]. 光学精密工程, 2010,18(9): 2002-2008
姜宏志, 赵慧洁, 李旭东, 李冬. 用于强反射表面形貌测量的投影栅相位法[J]. 光学精密工程, 2010,18(9): 2002-2008 DOI： 10.3788/OPE.20101809.2002.

JIANG Hong-zhi, ZHAO Hui-jie, LI Xu-dong, LI Dong. Projected fringe profilometry for profile measurement of high reflective surface[J]. 光学精密工程, 2010,18(9): 2002-2008 DOI： 10.3788/OPE.20101809.2002.

摘要

为了实现强反射表面三维形貌的光学非接触测量

提出一种改进的投影栅相位法。分析了强反射表面的反射光特点及其对相位解算的影响

指出了反射光亮度范围与相机动态范围的不一致是导致传统投影栅相位法测量失效的主要原因;提出了亮暗条纹投射、多曝光时间采集图像和图像合成等技术

使相机亮度测量范围与强反射表面的反射光亮度范围相一致

并分析了此方法的可行性和适应范围。最后

给出了改进投影栅相位法的条纹投射与图像采集步骤。实验结果表明

改进的投影栅相位法克服了强反射表面引起的条纹图像饱和或过暗问题

能够成功测量出99.6%以上的三维点云

有效解决了测量点云缺失问题

能够实现强反射表面三维形貌光学非接触测量。

Abstract

An improved non-contact optical measuring method

projected fringe profilometry

is proposed to realize the 3-D structure measurement of high reflective surfaces. The reflection characteristics of high reflective surfaces and their effects on phase computation are analyzed

and it is pointed out that the failure reason of the traditional projected fringe profilometry is the mismatch of the range of reflection intensity with the dynamic range of the measuring camera. Then

the techniques of light-dark fringe projection

multi-exposure time image acquisition and image synthesis are introduced to match the measuring range of intensity of camera with the range of reflection intensity. The feasibility and useable range of the method are analyzed. Finally

the processes of fringe projection and image acquisition in the improved profilometry are given. Experimental results indicate that the improved profilometry is able to handle the problems of fringe image saturation and dark images.Moreover

it has obtained 3-D data cloud more than 99.6%

and solve the problem of loss of 3-D data. In conclusions

the improved method can measure the 3-D profiles of high reflective surfaces with non-contact methods.

关键词

Keywords

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High reflection surface topography measurement based on fringe projection phase method and multi-exposure image fusion technology

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