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Measurement of thickness of metal thin film by using chromatic confocal spectral technology
Article | 更新时间:2020-08-12
    • Measurement of thickness of metal thin film by using chromatic confocal spectral technology

    • Optics and Precision Engineering   Vol. 19, Issue 1, Pages: 17-22(2011)
    • DOI:10.3788/OPE.20111901.0017    

      CLC: O484.5;TH744.1
    • Received:30 April 2010

      Revised:10 August 2010

      Published Online:22 January 2011

      Published:22 January 2011

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  • MA Xiao-jun, GAO Dang-zhong, YANG Meng-sheng, ZHAO Xue-sen, YE Cheng-gang, TANG Yong-jian. Measurement of thickness of metal thin film by using chromatic confocal spectral technology[J]. Editorial Office of Optics and Precision Engineering, 2010,19(1): 17-22 DOI: 10.3788/OPE.20111901.0017.

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