MA Xiao-jun, GAO Dang-zhong, YANG Meng-sheng, ZHAO Xue-sen, YE Cheng-gang, TANG Yong-jian. Measurement of thickness of metal thin film by using chromatic confocal spectral technology[J]. Editorial Office of Optics and Precision Engineering, 2010,19(1): 17-22
MA Xiao-jun, GAO Dang-zhong, YANG Meng-sheng, ZHAO Xue-sen, YE Cheng-gang, TANG Yong-jian. Measurement of thickness of metal thin film by using chromatic confocal spectral technology[J]. Editorial Office of Optics and Precision Engineering, 2010,19(1): 17-22 DOI: 10.3788/OPE.20111901.0017.
Measurement of thickness of metal thin film by using chromatic confocal spectral technology
To precisely measure the thickness and thickness distribution of a self-supporting metal film
the measurement technology based on a chromatic confocal spectral sensor was established. The measurement principle and system structure were descripted in detail
and the measurement uncertainty was analyzed. The thickness and thickness distribution of the self-supporting metal film with the thickness between 10-100 m were tested using the sensor group
precise displacement platform and precise calibrated samples. The measurement uncertainty was evaluated based on analysis of sensor accuracy
the uncertainty of calibration sample thickness
the positioning accuracy of two sensors and the system repetition uncertainty. Experimental results indicate that the measurement uncertainty is about 0.12 m
which satisfies the requirements of Inertial Confinement Fusion(ICF) for target parameter measurement in high stabilization
high precision and non-destruction.
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references
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