Stability of nano-scale thin metal films under tension

GUO Zhen-shan; WANG Shi-bin; LI Lin-an; JIA Hai-kun; MEN Yu-tao; HE Wei

doi:10.3788/OPE.20111909.2293

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Stability of nano-scale thin metal films under tension

Article | 更新时间：2020-08-12

- Stability of nano-scale thin metal films under tension
- Optics and Precision Engineering Vol. 19, Issue 9, Pages: 2293-2299(2011)
- 作者机构：
  
  天津大学力学系天津,300072
- 作者简介：
- 基金信息：
- DOI：10.3788/OPE.20111909.2293
  CLC： O484.1
- Received：08 March 2011，
  
  Revised：30 April 2011，
  
  Published Online：26 September 2011，
  
  Published：26 September 2011
- 稿件说明：
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郭振山, 王世斌, 李林安, 贾海坤, 门玉涛, 何巍. 纳米尺度金属薄膜在拉伸状态下的稳定性[J]. 光学精密工程, 2011,19(9): 2293-2299

GUO Zhen-shan, WANG Shi-bin, LI Lin-an, JIA Hai-kun, MEN Yu-tao, HE Wei. Stability of nano-scale thin metal films under tension[J]. Editorial Office of Optics and Precision Engineering, 2011,19(9): 2293-2299
郭振山, 王世斌, 李林安, 贾海坤, 门玉涛, 何巍. 纳米尺度金属薄膜在拉伸状态下的稳定性[J]. 光学精密工程, 2011,19(9): 2293-2299 DOI： 10.3788/OPE.20111909.2293.

GUO Zhen-shan, WANG Shi-bin, LI Lin-an, JIA Hai-kun, MEN Yu-tao, HE Wei. Stability of nano-scale thin metal films under tension[J]. Editorial Office of Optics and Precision Engineering, 2011,19(9): 2293-2299 DOI： 10.3788/OPE.20111909.2293.

摘要

将薄膜和基底作为一个基本结构来研究薄膜的变形和损坏可预测纳米薄膜器件的使用寿命。本文讨论和研究了薄膜基底结构在拉伸载荷下薄膜出现的分叉和断裂的过程。用在相同厚度的PET基底上沉积不同厚度铝膜的薄膜基底结构作为试件

分别对薄膜厚度为100

150和200 nm的3种不同试件进行了拉伸加载实验

并在OLYMPUS显微镜下观察了薄膜表面的变化情况。分析和对比结果表明:随着薄膜厚度的增加

薄膜出现分叉现象的失效应变也随着增大;当薄膜表面出现裂纹时

裂纹密度的大小取决于薄膜的厚度和加载应变的大小。

Abstract

This paper presents a basic structure combined with a film and a substrate to investigate the damage and deformation of thin films and to predict the life time of MEMS. The bifurcation and fracture of thin films under a tensive load were determined by an experiment where the film/substrate structure was used as the specimen.The substrate was a deposited aluminium film with different thicknesses of 100

150 and 200 nm. Then the experiment was initiated using our designed loading device. An OLYMPUS microscope was used to observe the change of the topography of the film surface. The destruction of the film and the corresponding sizes of the load and displacement were recorded.Finally

the effects of film thickness on bifurcation and fracture were obtained by comparing experimental results. These show that the relevant rupture strain increases with the film thickness and the crack density along the loading direction depends on the thickness of the film and the failure stain when there are cracks appear on the film surface.

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references

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