Precise measurement of 1/f noise and its application to reliability screening for solar cells

ZHOU Qiu-zhan; ZHANG Yan-chuang; ZHOU Cheng-peng; WU Dan-e

doi:10.3788/OPE.20122003.0625

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Precise measurement of 1/f noise and its application to reliability screening for solar cells

Article | 更新时间：2020-08-12

- Precise measurement of 1/f noise and its application to reliability screening for solar cells
- Optics and Precision Engineering Vol. 20, Issue 3, Pages: 625-631(2012)
- 作者机构：
  
  吉林大学通信工程学院, 吉林长春 130025
- 作者简介：
- 基金信息：
- DOI：10.3788/OPE.20122003.0625
  CLC： TM914.4
- Received：12 October 2011，
  
  Revised：01 December 2011，
  
  Published Online：22 March 2012，
  
  Published：22 March 2012
- 稿件说明：
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周求湛, 张彦创, 周承鹏, 吴丹娥. 1/f噪声的精确测量及其在太阳能电池可靠性筛选中的应用[J]. 光学精密工程, 2012,(3): 625-631

ZHOU Qiu-zhan, ZHANG Yan-chuang, ZHOU Cheng-peng, WU Dan-e. Precise measurement of 1/f noise and its application to reliability screening for solar cells[J]. Editorial Office of Optics and Precision Engineering, 2012,(3): 625-631
周求湛, 张彦创, 周承鹏, 吴丹娥. 1/f噪声的精确测量及其在太阳能电池可靠性筛选中的应用[J]. 光学精密工程, 2012,(3): 625-631 DOI： 10.3788/OPE.20122003.0625.

ZHOU Qiu-zhan, ZHANG Yan-chuang, ZHOU Cheng-peng, WU Dan-e. Precise measurement of 1/f noise and its application to reliability screening for solar cells[J]. Editorial Office of Optics and Precision Engineering, 2012,(3): 625-631 DOI： 10.3788/OPE.20122003.0625.

摘要

为了实现对太阳能电池可靠性的筛选分类

建立了一套低频噪声自动测试系统。首先

根据太阳能电池1/

噪声的来源

确定了在大电流密度情况下以1/

噪声功率谱作为太阳能电池可靠性指示的可行性。然后

由测试得到的功率谱曲线明确了通过比较在

为1 Hz频点处的1/

噪声功率谱值大小可以区分太阳能电池的可靠性。最后

根据半导体器件可靠性试验验证的分类标准

给出了确定筛选阈值的方法。实验结果表明:该方法可以在短时间内无损地完成一批太阳能电池3个等级的可靠性分类

平均每个太阳能电池的测试时间只需5 min。采用该筛选方法

能精确检测单一器件

解决了传统方法花费大、周期长

易引起器件的损伤

且只能得到一批器件可靠性的统计规律的问题。该方法适用于对太阳能电池可靠性要求高的应用场合。

Abstract

An automatic measurement system for low frequency noises is established to sort solar cells according to their reliability. First

according to the sources of the 1/

noise of a solar cell

this paper identifies the feasibility of 1/

noise under big current density to be the reliability indication of the solar cell. Then

according to the noise spectral character measured by the automatic measurement system

it points out that comparing the 1/

noise spectrum of different solar cells in

at 1 Hz is an effective method to distinguish the reliability of different solar cells.Finally

the method to determine the threshold of screening solar cells is given based on the standard of semiconductor device quality classification. Experimental results indicate that this kind of method can nondestructively sort the solar cells into three groups according to their reliability

and spends only 5 min for measuring single solar cell. The proposed method can detect every single solar cell correctly and has advantages over traditional methods in costs

time and hard to be hurt. This method can satisfy the application requirements of screening solar cells for high reliability.

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Keywords

references

GEOFFREY K. Solar Cells and Their Applications.[M].2nd ed. Canada, New Jersey: John Wiley & Sons, Inc, 2010.[2] 周春兰,王文静,李海玲,等. 用电学参数表征晶体硅太阳电池特性 [J].光学精密工程,2008,16(7):1164-1169. ZHOU CH L, WANG W J, LI H L, et al.. Characterization of crystalline silicon solar cells by electrical parameters [J]. Opt. Precision Eng., 2008, 16(7): 1164-1169. (in Chinese)[3] 蔡建文,李萍萍,徐传明,等. 太阳电池测试系统及其参数匹配优化研究 [J].光学精密工程,2007,15(4):518-520. CAI J W, LI P P, XU C M, et al.. Study on solar cell testing system and its parameter matching optimization[J]. Opt. Precision Eng., 2007, 15(4): 518-520. (in Chinese)[4] VANDAMME L K J, ALABEDRA R, ZOMMITI M. 1/f noise as a reliability estimation for solar cells [J]. Solid-State Electronics, 1983, 26(7): 671-674.[5] KLEINPENNING T G M, SCHURINK F, VAN DER VEER J H C, et al.. 1/f noise as a sensitive parameter in the life prediction testing of photovoltaic modules [J]. Solar Cells, 1984, 12(4): 363-370.[6] JAYAWEERA P V V, PITIGATA P K D D P, PERERA A G U, et al.. l/f noise and dye-sensitized solar cells [J]. Semiconductor Science and Technology, 2005, 20(7):40-42.[7] JAYAWEERA P V V, PITIGATA P K D D P, SENEVIRATNE M K I, et al.. l/f noise in dye-sensitized solar cells and NIR photon detectors [J]. Infrared Physics & Technology, 2007, 50(2-3): 270-273.[8] KLEINPENNING T G M. l/f Noise in p-n diodes [J]. Physica B-C, 1980, 98(4): 289-299.[9] BREITENSTEIN O, BAUER J, ALTERMATT P P, et al.. Influence of defects on solar cell characteristics [J]. Solid State Phenomena, 2010,156-158(1):1-10.[10] SMULKO J, AZENS A, MARSAL R, et al.. Application of 1/f current noise for quality and age monitoring of electrochromic devices [J]. Solar Energy Materials & Solar Cells, 2008, 92(8): 914-918.[11] JIRI V, PAVEL K, JAN D, et al.. Micro-plasma luminescence and signal noise used to solar cells defects diagnostic [J]. AIP Conference Proceedings, 2009,1129(1):641-644.[12] MACKU R, KOKTAVY P, KARVADA P, et al.. Diagnostics of forward biased silicon solar cells using noise spectroscopy [J]. AIP Conference Proceedings, 2009, 1129(1): 145-148.[13] MACKU R, KOKTAVY P, KARVADA P. Advanced non-destructive diagnostics of monocrystalline silicon solar cells [J]. Wseas Transac-tions on Electronics, 2007, 4(9): 192-197.[14] CHOBOLA Z. Noise as a tool for non-destructive testing of single-crystal silicon solar cells [J]. Microelectronics Reliability, 2001, 41(12): 1947-1952.[15] 吴丹娥. 太阳能电池低频噪声测试系统设计及其可靠性筛选方法研究. 长春:吉林大学,2011. WU D E. Low-frequency noise measurement system design and study of reliability screening methods for solar cells.Changchun:Jilin University, 2011.(in Chinese)[16] KONCZAKOWSKA A. Methodology of semiconductor devices classification into groups of differentiated quality [J]. Microelectronics Reliability, 2008, 48(1): 37-44.

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