ZHANG Ming-zhao, MOU Jian-hua, LIU Yang, PENG Xiao-jun, WANG Bo-xiong. Phase extraction for fringe patterns based on complex Morlet wavelet transform[J]. Editorial Office of Optics and Precision Engineering, 2012,(3): 643-650
ZHANG Ming-zhao, MOU Jian-hua, LIU Yang, PENG Xiao-jun, WANG Bo-xiong. Phase extraction for fringe patterns based on complex Morlet wavelet transform[J]. Editorial Office of Optics and Precision Engineering, 2012,(3): 643-650 DOI: 10.3788/OPE.20122003.0643.
Phase extraction for fringe patterns based on complex Morlet wavelet transform
To reduce the effect of large number of invalid data in fringe patterns on calculation results in the measurement of high dynamic flows using interferometry or Moir? deflectometry
an effective phase extraction method was proposed based on the wavelet transform using complex Morlet wavelet. Through choosing proper parameters for the wavelet
the maximum modulus of the wavelet transform of a pattern was proportional to its modulation factor
then it was used as a weighting factor of a phase unwrapping algorithm based on weighted least squares to guarantee reliable phase unwrapping. In the process of wavelet ridge routing
a simple algorithm based on curve fitting was proposed to substantially reduce the routing time and the precision deterioration due to image noise. In simulation experiment
the relative error between calculated phase and actual phase is less than 0.01%. In internal wave measurement experiment
the method is used to analyze the fringe patterns
and the density gradient measurement precision has reached 5?10
-6
g/cm
4
. It shows that the method can reduce the effect of invalid data on analysis precision effectively and can obtain reliable unwrapped phases.
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references
DALZIEL S B, HUGHES G O, SUTHERLAND B R. Whole-field density measurements by "synthetic schlieren"[J]. Exp. Fluids, 2000, 28:322-335.[2] 姜宏志,赵慧洁,李旭东,等. 用于强反射表面形貌测量的投影栅相位法 [J]. 光学 精密工程, 2010, 18(9):2002-2008. JIANG H Z, ZHAO H J, LI X D, et al.. Projected fringe profilometry for profile measurement of high reflective surface[J]. Opt. Precision Eng., 2010, 18(9):2002-2008. (in Chinese)[3] PFEIFER T, WANG B X, TUTSCH R. Phase-shifting moiré deflectometry[J]. Optik, 1995, 98:158-163.[4] 单鹂娜,于晓洋,于双,等. 彩色梯度相移与格雷码相结合的三维测量方法 [J]. 光学 精密工程, 2010, 18(11):2497-2504. SHAN L N, YU X Y, YU SH, et al.. Three dimensional measurement method combining color trapezoidal phase-shifting with color gray code[J]. Opt. Precision Eng., 2010, 18(11):2497-2504. (in Chinese)[5] PANDIT S M, CHAN D P. Comparison of Fourier-transform and data-dependent system profilometry by use of interferometric regeneration[J]. Appl. Opt., 1999, 38(19):4095-4102.[6] QIAN K. Windowed Fourier transform for fringe pattern analysis[J]. Appl. Opt., 2004, 43:2695-2702.[7] FORMARO G, FRANCESCHETTI G, LANARI R, et al.. Global and local phase-unwrapping techniques: a comparison[J]. J. Opt. Soc. Am. A, 1997, 14(10): 2702-2708.[8] BALDI A, BERTOLINO F, GINESU F. On the performance of some unwrapping algorithms[J]. Opt. Precision Eng., 2002, 37:313-330.[9] BONEE D J. Fourier fringe analysis: the two dimensional phase unwrapping problem[J]. Appl. Opt., 1991, 30(25): 3627-3632.[10] XU Y, AI C. Simple and effective phase unwrapping technique[J]. SPIE, 1993, 2003:254-263.[11] KAUFMANN G H, GALIZI G E. Evaluation of a preconditioned conjugated gradient algorithm for weighted least-squares unwrapping of digital speckles pattern interferometry phase maps[J]. Appl. Opt., 1998, 37(14):3076-3084.[12] WATKINS L R, TAN S M, BARNES T H. Determination of interferometer phase distributions by use of wavelets[J]. Opt. Lett., 1999, 24:905-907.[13] TOMASSINI P, GIULIETTI A, GIZZI L, et al.. Analyzing laser plasma interferograms with a continuous wavelet transform ridge extraction technique: the method[J]. Appl. Opt., 2001, 40(35):6561-6568.[14] LIU H, CARTWRIGHT A, BASARAN C. Moir interferogram phase extraction: a ridge detection algorithm for continuous wavelet transforms[J]. Appl. Opt., 2004, 43(4):850-857.[15] AFIFI M, FASSI-FIHRI A, MARJANE M, et al.. Paul wavelet-based algorithm for optical phase distribution evaluation[J]. Optics Communications, 2002, 211:47-51.[16] 孟涛, 张明照,王克军,等. 光栅纹影偏折法测量二维层化流体密度梯度 [J]. 光学 精密工程, 2008, 16(6):973-977. MENG T, ZHANG M ZH, WANG K J, et al.. Measurement of density gradient for 2D flow fields using grating Schlieren deflectometry[J]. Opt. Precision Eng., 2008, 16(6):973-977. (in Chinese)