您当前的位置:
首页 >
文章列表页 >
Measurement of thickness uniformity for glass plate by spatial carrier
Article | 更新时间:2020-08-12
    • Measurement of thickness uniformity for glass plate by spatial carrier

    • Optics and Precision Engineering   Vol. 21, Issue 2, Pages: 260-266(2013)
    • DOI:10.3788/OPE.20132102.0260    

      CLC: TB92;O436.1
    • Received:05 July 2012

      Revised:11 October 2012

      Published Online:23 February 2013

      Published:15 February 2013

    移动端阅览

  • CAI Huai-Yu LI Hong-yue ZHU Meng HUANG Zhan-hua. Measurement of thickness uniformity for glass plate by spatial carrier[J]. Editorial Office of Optics and Precision Engineering, 2013,21(2): 260-266 DOI: 10.3788/OPE.20132102.0260.

  •  
  •  

0

Views

162

下载量

6

CSCD

Alert me when the article has been cited
提交
Tools
Download
Export Citation
Share
Add to favorites
Add to my album

Related Articles

Wrapping phase repair method based on Tsallis Relative Entropy evaluation
High-precision laser confocal measurement of semiconductor wafer thickness
Phase unwrapping technology about point diffraction interference fringe based on atrous spatial convolutional networks
Influence of frequency mixing on measurement accuracy of full-field heterodyne dynamic interferometer
Thickness measurement of radial gradient index lens under eccentricity by spectral confocal method

Related Author

ZHU Xindong
LIAN Liping
LÜ Qiujuan
YANG Pengcheng
KANG Leqian
YANG Shuai
QIU Lirong
WANG Yaoying

Related Institution

Ministry of Education Key Laboratory for Nonequilibrium Synthesis and Modulation of Condensed Matter, School of Physics, Xi'an Jiaotong University
School of Mechanical and Electrical Engineering, Xi'an Polytechnic University
Department of Basic, Rocket Force University of Engineering
College of Optoelectronic Engineering, Chongqing University
MIIT Key Laboratory of Complex-field Intelligent Exploration, Beijing Institute of Technology, School of Optics and Photonics, Beijing Institute of Technology
0