您当前的位置:
首页 >
文章列表页 >
Grey incidence analytic method to error analysis of binocular vision measurement system
Article | 更新时间:2020-08-12
    • Grey incidence analytic method to error analysis of binocular vision measurement system

    • Optics and Precision Engineering   Vol. 21, Issue 2, Pages: 503-513(2013)
    • DOI:10.3788/OPE.20132102.0503    

      CLC: TP391
    • Received:24 September 2012

      Revised:19 November 2012

      Published Online:23 February 2013

      Published:15 February 2013

    移动端阅览

  • TANG Wei YE Dong YUAN Feng CHEN Gang. Grey incidence analytic method to error analysis of binocular vision measurement system[J]. Editorial Office of Optics and Precision Engineering, 2013,21(2): 503-513 DOI: 10.3788/OPE.20132102.0503.

  •  
  •  

0

Views

827

下载量

5

CSCD

Alert me when the article has been cited
提交
Tools
Download
Export Citation
Share
Add to favorites
Add to my album

Related Articles

Deflectometric measurement technology for optical surfaces: principles, challenges, and prospects(invited)
EIS for ground-based imaging systems supporting scene switching perception
High-precision measurement of Wolter-I mandrel for X-ray microscopy by using double confocal probes
Axis alignment and error analysis of a novel rotating laser-scanning system
Magnetic field time-gate displacement sensor based on discrete winding and its error characteristics

Related Author

ZHANG Xiangchao
NIU Xingman
HAO Siyuan
LANG Wei
LI Pingfeng
LIU Ruiyang
ZHANG Zonghua
SONG Liduo

Related Institution

School of Information Science and Technology, Fudan University
College of Mechanical Engineering, Hebei University of Technology
Changchun Institute of Optics,Fine Mechanics and Physics,Chinese Academy of Sciences
Academy for Advanced Interdisciplinary Studies, Northeast Normal University
Institute of Precision Optical Engineering, School of Physics Science and Engineering, Tongji University
0