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Clearing residual resist in nanoimprint lithography by multi-mask
更新时间:2020-08-12
    • Clearing residual resist in nanoimprint lithography by multi-mask

    • Optics and Precision Engineering   Vol. 21, Issue 6, Pages: 1434-1439(2013)
    • DOI:10.3788/OPE.20132106.1434    

      CLC: TN305.7
    • Received:17 January 2013

      Revised:11 March 2013

      Published Online:20 June 2013

      Published:15 June 2013

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  • CHEN Xin ZHAO Jian-yi WANG Zhi-hao WANG Lei ZHOU Ning LIU Wen. Clearing residual resist in nanoimprint lithography by multi-mask[J]. Editorial Office of Optics and Precision Engineering, 2013,21(6): 1434-1439 DOI: 10.3788/OPE.20132106.1434.

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