Photoelectric parameter measurement system based on Cortex-M3 for LEDs

WANG Li-dong; MAO Zhen-hua; NI Wei

doi:10.3788/OPE.20142204.0856

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Photoelectric parameter measurement system based on Cortex-M3 for LEDs

Modern Applied Optics | 更新时间：2020-08-13

- Photoelectric parameter measurement system based on Cortex-M3 for LEDs
- Optics and Precision Engineering Vol. 22, Issue 4, Pages: 856-862(2014)
- 作者机构：
  
  浙江省计量科学研究院,浙江杭州,310013
- 作者简介：
- 基金信息：
- DOI：10.3788/OPE.20142204.0856
  CLC： TN312.8
- Received：11 September 2013，
  
  Revised：24 October 2013，
  
  Published：25 April 2014
- 稿件说明：
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汪黎栋, 茅振华, 倪魏. 基于Cortex-M3的快速发光二极管光电参数测量系统[J]. 光学精密工程, 2014,22(4): 856-862

WANG Li-dong, MAO Zhen-hua, NI Wei. Photoelectric parameter measurement system based on Cortex-M3 for LEDs[J]. Editorial Office of Optics and Precision Engineering, 2014,22(4): 856-862
汪黎栋, 茅振华, 倪魏. 基于Cortex-M3的快速发光二极管光电参数测量系统[J]. 光学精密工程, 2014,22(4): 856-862 DOI： 10.3788/OPE.20142204.0856.

WANG Li-dong, MAO Zhen-hua, NI Wei. Photoelectric parameter measurement system based on Cortex-M3 for LEDs[J]. Editorial Office of Optics and Precision Engineering, 2014,22(4): 856-862 DOI： 10.3788/OPE.20142204.0856.

摘要

针对发光二极管（LED）分选设备对光电参数测量系统的需求，研制了一种基于Cortex-M3（以下简称M3）的快速LED光电参数（包括光参数和电参数两部分）测量系统。该系统分为光参数检测模块（自制光谱仪）、电参数测量模块及显示模块等3部分。光参数检测模块采用M3作为主处理器，对测量获得的光谱数据进行计算，进而得出实测的LED光参数，并将光参数传递给同样以M3为主处理器的电参数测量模块。利用该系统架构，有效提高了LED参数测量的速度和性能。最后，在脱离LED分选机械控制的前提下，利用研制的LED光电参数测量系统进行了LED的实际快速测量。结果显示：电参数测量周期小于31 ms，光参数测量周期可小至10 ms，色坐标一致性误差小于0.002 5%。

Abstract

According to the demands of Light Emitting Diode(LED) separation equipment for the photoelectric parameter measurement system

this paper describes a self-designed fast LED photoelectric parameter measurement system based on Cortex-M3 (hereinafter referred to as M3). The system consists of an optical parameter detection module (homemade spectrometer)

an electrical test module and a display module. The optical parametric module uses the M3 as the main processor to acquire the spectral data and then gets the actual chromatic parameters to pass to the same M3-based processor module of electrical parameters. It greatly improves the LED parameter measuring speed and performance. Finally

without control of LED sorting machenisms

the designed LED photoelectric parameter measurement system was realized experimetally

in which the electrical testing period is less than 31 ms

optical testing period can be as small as 10 ms

and the deviation in consistency of chromaticity coordinate is less than 0.002 5%.

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references

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