Analysis and correction of eccentricity errors in microsphere surface inspection

LU Bing-hui; LIU Guo-dong; SUN He-yi; LIU Bing-guo; CHEN Feng-dong

doi:10.3788/OPE.20152310.2794

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Analysis and correction of eccentricity errors in microsphere surface inspection

Modern Applied Optics | 更新时间：2020-08-13

- Analysis and correction of eccentricity errors in microsphere surface inspection
- Optics and Precision Engineering Vol. 23, Issue 10, Pages: 2794-2802(2015)
- 作者机构：
  
  哈尔滨工业大学电气工程及自动化学院,黑龙江哈尔滨 150001
- 作者简介：
- 基金信息：
- DOI：10.3788/OPE.20152310.2794
  CLC： TB92;TH703
- Received：16 April 2015，
  
  Revised：16 May 2015，
  
  Published：25 October 2015
- 稿件说明：
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卢丙辉, 刘国栋*, 孙和义等. 微球表面形貌检测中的偏心误差分析与修正[J]. 光学精密工程, 2015,23(10): 2794-2802

LU Bing-hui, LIU Guo-dong*, SUN He-yi etc. Analysis and correction of eccentricity errors in microsphere surface inspection[J]. Editorial Office of Optics and Precision Engineering, 2015,23(10): 2794-2802
卢丙辉, 刘国栋*, 孙和义等. 微球表面形貌检测中的偏心误差分析与修正[J]. 光学精密工程, 2015,23(10): 2794-2802 DOI： 10.3788/OPE.20152310.2794.

LU Bing-hui, LIU Guo-dong*, SUN He-yi etc. Analysis and correction of eccentricity errors in microsphere surface inspection[J]. Editorial Office of Optics and Precision Engineering, 2015,23(10): 2794-2802 DOI： 10.3788/OPE.20152310.2794.

摘要

由于使用传统的误差修正方法进行微球形貌检测会有过大的残差

本文提出了一种新的偏心误差修正方法来提高微球表面形貌检测的精度和效率。在分析了横向偏心和轴向偏心引入光程差数学模型的基础上

推导了偏心误差的高阶近似模型

提出了小曲率半径下基于Zernike多项式拟合的偏心误差修正方法

并给出误差修正的流程及相关参数的标定方法。通过对2 mm直径的微球的表面形貌检测验证了所提出误差修正方法的可行性和有效性。结果表明:相对于零条纹时的形貌误差基准

采用本文提出的方法修正后的残余形貌误差峰谷(PV)值为0.081 5λ

均方根(RMS)值为0.016 1λ

比传统方法修正效果更好

能够满足高精度微球形貌检测的需求。

Abstract

When traditional error correction methods are used in microsphere surface inspection

it might show a larger residual. Therefore

this paper proposes a surface topography to correct the eccentricity of microsphere and to improve the measuring precision and efficiency. Based on the analysis of mathematic model of optical path difference introduced by the lateral and axial eccentricities

the high-order approximation model of eccentricity error was deduced. A eccentricity correction method for small sphere curvature radius was proposed on the basis of Zernike polynomials fitting. The correction flow was provided for illustrating the detail

and the corresponding calibration method of relative parameters was given. An experiment for the surface topography of a microphere with a diameter of 2 mm was performed to verify the feasibility and effectiveness of the correction method. The experimental results relative to the standard profile data indicate that the proposed correction method offers the surface errors(peak-valley(PV) and root-mean-square(RMS) values) to be 0.081 5λ and 0.016 1λ

respectively

which are more excellent than that of the traditional methods. The method is able to meet the demand of high precise inspection of microspheres.

关键词

Keywords

references

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