HU Jin, DONG Xiao-xuan, PU Dong-lin etc. High resolution pattern-integrated interference lithography based on blazed grating[J]. Editorial Office of Optics and Precision Engineering, 2015,23(12): 3335-3342
HU Jin, DONG Xiao-xuan, PU Dong-lin etc. High resolution pattern-integrated interference lithography based on blazed grating[J]. Editorial Office of Optics and Precision Engineering, 2015,23(12): 3335-3342 DOI: 10.3788/OPE.20152312.3335.
High resolution pattern-integrated interference lithography based on blazed grating
To improve the quality of pattern interference lithography
a Pattern-integrated Interference Lithographic( PIIL) system based on a blazed grating was proposed
and the theory of optical system and the method to realize a high quality pattern were investigated. Firstly
the optical field properties of the typical PIIL system were analyzed and how to improve the resolution of the system was described. The influences of the system bandwidth and the pattern feature on the image quality were discussed and the process technique to enhance the pattern uniformity in the interference exposure was given. Then
a novel pattern-integrated interference lithographic method was proposed. The blaze grating was used as a diffraction beam splitter to realize the integration of phase and amplitude modulation and the numerical calculation was used to simulate the diffraction properties of the blazed grating and the optical field distribution on an image plane. The parameter optimization of the blazed grating was discussed and the diffraction efficiency up to 92.3% was obtained for ±1 order. Finally
the pattern-integrated interference exposure system was presented based on a Digital Mirror Device(DMD)
a micro imaging path and the patterns of pixelated dot-matrix were obtained and the quality of pattern of interference lithography was improved markedly. The results verify the applicability of the method for arbitrary structures.
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references
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