FU Jian, LIU Zhen-zhong,. Correction of random shift of rotation center for nano-scale CT system in X-ray microcopy[J]. Editorial Office of Optics and Precision Engineering, 2015,23(10z): 644-650
FU Jian, LIU Zhen-zhong,. Correction of random shift of rotation center for nano-scale CT system in X-ray microcopy[J]. Editorial Office of Optics and Precision Engineering, 2015,23(10z): 644-650 DOI: 10.3788/OPE.20152313.0645.
Correction of random shift of rotation center for nano-scale CT system in X-ray microcopy
To correct the random shift of rotation center of a full field transmission X-ray microscopy nano-scale CT and suppress the reconstruction artifacts
a method based on the calculation formula of mass center and the least square sinusoid fitting was proposed and investigated. First
the projection sinogram was obtained by the logarithm operation on the original data captured by a detector. Then the mass center position was calculated out in row by row at each view angle and the sinusoid curve was fitted by least square method. Finally
the random shift of the mass center was obtained and inputted to the image reconstruction formula to correct the shift of the rotation center. The results from the numerical simulation with the Shepp-Logan phantom and the experiment by a micro-nano composite with a diameter of 60
m at the full field transmission X-ray nano-scale CT system of Beijing Synchrotron Radiation Facility indicate that the normalized root square error after correction is less than 0.3412 and the reconstruction accuracy is improved by 82%. The proposed method can correct the random shift of the rotation center and suppress the reconstruction artifacts. Compared with current methods
it shows better practicability.
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