您当前的位置:
首页 >
文章列表页 >
Correction of random shift of rotation center for nano-scale CT system in X-ray microcopy
更新时间:2020-08-13
    • Correction of random shift of rotation center for nano-scale CT system in X-ray microcopy

    • Optics and Precision Engineering   Vol. 23, Issue 10z, Pages: 644-650(2015)
    • DOI:10.3788/OPE.20152313.0645    

      CLC: TP391;TG115.281
    • Received:01 June 2015

      Revised:30 June 2015

      Published:14 November 2015

    移动端阅览

  • FU Jian, LIU Zhen-zhong,. Correction of random shift of rotation center for nano-scale CT system in X-ray microcopy[J]. Editorial Office of Optics and Precision Engineering, 2015,23(10z): 644-650 DOI: 10.3788/OPE.20152313.0645.

  •  
  •  

0

Views

407

下载量

0

CSCD

Alert me when the article has been cited
提交
Tools
Download
Export Citation
Share
Add to favorites
Add to my album

Related Articles

Identification of rotational center in remote angular-velocity measurement with spatial filtering
Testing asphere by subaperture stitching interferometric method

Related Author

ZENG Xiang-kai
ZHU Zhi-xiong
CHEN Yang
LIU Quan-shun
WANG Xiao-kun
WANG Li-hui
ZHANG Xue-jun

Related Institution

School of Optoelectronic Information, Chongqing University of Technology
Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences
Graduate School of the Chinese Academy of Sciences
0