Measurement of normal emissivity of materials at low temperature

YUAN Lin-guang; XUE Zhan-li; LI Hong-guang; LI Tao; YANG Hong-ru

doi:10.3788/OPE.20162401.0059

您当前的位置：

首页 >

文章列表页 >

Measurement of normal emissivity of materials at low temperature

更新时间：2020-08-13

- Measurement of normal emissivity of materials at low temperature
- Optics and Precision Engineering Vol. 24, Issue 1, Pages: 59-64(2016)
- 作者机构：
  
  西安应用光学研究所国防科技工业光学一级计量站,陕西西安,710065
- 作者简介：
- 基金信息：
- DOI：10.3788/OPE.20162401.0059
  CLC： TB302;TN219
- Received：20 October 2015，
  
  Revised：07 December 2015，
  
  Published：25 January 2016
- 稿件说明：
移动端阅览
袁林光, 薛战理, 李宏光等. 低温状态下的材料法向发射率测量[J]. 光学精密工程, 2016,24(1): 59-64

YUAN Lin-guang, XUE Zhan-li, LI Hong-guang etc. Measurement of normal emissivity of materials at low temperature[J]. Editorial Office of Optics and Precision Engineering, 2016,24(1): 59-64
袁林光, 薛战理, 李宏光等. 低温状态下的材料法向发射率测量[J]. 光学精密工程, 2016,24(1): 59-64 DOI： 10.3788/OPE.20162401.0059.

YUAN Lin-guang, XUE Zhan-li, LI Hong-guang etc. Measurement of normal emissivity of materials at low temperature[J]. Editorial Office of Optics and Precision Engineering, 2016,24(1): 59-64 DOI： 10.3788/OPE.20162401.0059.

摘要

研究了在-60～50 ℃条件下准确测量材料法向发射率的方法。基于发射率定义建立了材料法向发射率测量模型。为屏蔽环境杂散辐射与大气吸收的影响

利用真空液氮背景通道搭建了低温状态下材料发射率测量装置。测量了氧化铜与高发射率陶瓷两种样品的法向发射率随温度、波长的变化情况。结果表明:两种样品的法向光谱发射率均随波长增加而降低;随温度的升高

氧化铜样品法向积分发射率稳定为0.8500.012

陶瓷样品的法向积分发射率降低了0.124。最后

实现了低温状态下红外光谱辐射的高精度采集

对低温状态下材料法向光谱发射率测量结果的不确定度进行了评定

得到的结果显示其相对扩展不确定度小于6.0%。

Abstract

The measuring methods for normal emissivities of materials at -60-50 ℃ was explored. To achieve accurate measurement of normal emissivity of materials at temperature range of -60 ℃ to 50 ℃

a measurement model of normal emissivity of materials was established based on the emissivity definition. To shield the effects of environment stray radiation and atmospheric absorption

a measurement facility of the materials at low temperature was built by utilizing a vacuum and liquid nitrogen background channel. The normal emissivities of two samples (copper oxide and high emissivity ceramic) were measured by this facility. The results show that normal spectral emissivities of two samples decrease with wavelengths. Moreover

with temperature increasing

the normal integral emissivity of the copper oxide keeps stable at the range of 0.8500.012 and that of the high emissivity ceramic reduces by 0.124. Finally

the infrared spectral irradiation was acquired in higher precision at a lower temperature condition

the measurement uncertainty of normal spectral emissivities of materials at low temperature was analyzed. The results show that the relative expanded uncertainty is less than 6.0%.

关键词

Keywords

references

HANSSEN L, MEKHONTSER S. Infrared spectral emissivity characteritation facility at NIST [J]. Radiation Thermometry and Calibration, 2004, 10:1117-1124.

王自荣,孙晓泉. 光电隐身性能的表征概述[J]. 激光与红外,2005,35(1): 11-14. WANG Z R, SUN X Q. Summary on property characterizations of electro-optic camouflage [J]. Laser & Infrared, 2005, 35(1): 11-14. (in Chinese)

WRIGHT D, GREGO L. Physics of Space Security [M]. American Academy of Arts& Sciences, 2005.

戴景民,宋扬,王宗伟. 光谱发射率测量技术[J]. 红外与激光工程,2009,38(4):710-715. DAI J M, SONG Y, WANG Z W.Review of pectral emissivity measurement[J]. Infrared and Laser Engineering, 2009,38(4):710-715.(in Chinese)

万玉柱. 基于真空条件下的材料发射率测试方案设计[D]. 哈尔滨:哈尔滨工业大学,2008. WAN Y ZH. Material Emissivity Testing Based on Vacuum Environment [D]. Harbin: Harbin Institute of Technology, 2008.(in Chinese)

HENDERSON J R. Remote measurement of ground temperature and emissivity[J]. SPIE, 1994, 2269:610-621.

ISHII J, ONO A. Uncertainty estimation for emissivity measurements near room temperature with a Fourier transforms spectrometer [J].Meas. Sci., and Tech.,2001,12:2103-2112.

GJB5023.2-2003. 材料涂层反射率和发射率测试方法第2部分:发射率[S]. 北京:总装备部军标出版发行部,2003:1-5. GJB5023.2-2003.The method of measuring reflectivity and emissivity for material and coating Part 2: Emissivity [S].Beijing:The General Armament Department of the Army Publishing Department,2003:1-5.(in Chinese)

李希明, 李文军, 顾喆涵,等. 在中低温条件下环境辐射对光谱发射率测量的影响[J]. 计量学报, 2014, 35(1):10-12. LI X M,LI W J,GU ZH H, et al.. Effect on environment radiation in measurements for spectral emissivity at medium and low temperatures [J]. Acta Metrologica Sinica, 2014, 35(1):10-12 (in Chinese)

李宏光,杨鸿儒,薛战理,等. 窄带光谱滤光法探测低温黑体太赫兹辐射[J]. 光学精密工程,2013,21(6):1410-1416. LI H G,YANG H R, XUE ZH L, et al.. Terahertz radiation detection of low temperature blackbody based on narrow band spectral filter method [J]. Opt. Precision Eng., 2013, 21(6):1410-1416. (in Chinese)

王新北. 基于傅里叶红外光谱仪的材料光谱发射率测量测量技术的研究[D]. 哈尔滨:哈尔滨工业大学,2007. WANG X B. Study on Measurement of Spectral Emissivity of Materials Based on Fourier Infrared Spectrometer [D]. Harbin: Harbin Institute of Technology, 2007. (in Chinese)

Views

756

下载量

CSCD

Alert me when the article has been cited

提交

Tools

Publicity Resources

Measurement uncertainty evaluation and analysis for industrial computed tomography based on forest balls

Measuring methods and instruments of high precision gear helix artifact

Thin ring gauge artifact for probing error evaluation of multi-sensor coordinate measuring machine

Detection of angular tracing precision of rotating mirror house in streak camera

Acceleration measurement model and uncertainty evaluation of 10^-6 order precision centrifuge

Related Author

HUANG Kuidong

ZHOU Liyuan

ZHA Haiyong

HUANG Ziying

YANG Zenan

Liding WANG

Zhaoyao SHI

Honglin REN

Related Institution

Science and Technology on Advanced High Temperature Structural Materials Laboratory， AECC Beijing Institute of Aeronautical Materials

AECC Sichuan Gas Turbine Research Establishment

The Key Laboratory of High Performance Manufacturing for Aero Engine （Northwestern Polytechnical University）， Ministry of Industry and Information Technology

Key Laboratory for Precision & Non-traditional Machining of Ministry of Education， Dalian University of Technology

Key Laboratory for Micro/Nano Technology and System of Liaoning Province， Dalian University of Technology

AI问答

Address：No.3888 Dong Nanhu Road, Changchun, Jilin, China Postal code：130033
Tel：0431-86176855 Email：gxjmgc@ciomp.ac.cn
Technical support is provided by Beijing Founder electronics co., LTD 吉ICP备11002662号-17 京公网安备11010802024621
It is recommended to read the content of this site in Chrome&IE9+. Please switch to extreme mode in browser 360.
Cookies We use cookies to help provide and enhance our service and tailor content. By continuing, you agree to the use of cookies.

⁰