Phase-modulated ellipsometry combined photo-elastic modulation with electro-optic modulation

LI Ke-wu; WANG Li-ming; WANG Zhi-bin; ZHANG Rui; XUE Rui; CHEN You-hua

doi:10.3788/OPE.20162404.0690

您当前的位置：

首页 >

文章列表页 >

Phase-modulated ellipsometry combined photo-elastic modulation with electro-optic modulation

更新时间：2020-08-13

- Phase-modulated ellipsometry combined photo-elastic modulation with electro-optic modulation
- Optics and Precision Engineering Vol. 24, Issue 4, Pages: 690-697(2016)
- 作者机构：
  
  1. 山西省光电信息与仪器工程技术研究中心,山西太原,030051
  2. 中北大学信息与通信工程学院,山西太原,030051
  3. 中北大学电子测试技术重点实验室,山西太原,030051
- 作者简介：
- 基金信息：
- DOI：10.3788/OPE.20162404.0690
  CLC： O436.3;TH744.2
- Received：13 November 2015，
  
  Revised：03 January 2016，
  
  Published：25 April 2016
- 稿件说明：
移动端阅览
李克武, 王黎明, 王志斌等. 弹光和电光级联的组合相位调制型椭偏测量术[J]. 光学精密工程, 2016,24(4): 690-697

LI Ke-wu, WANG Li-ming, WANG Zhi-bin etc. Phase-modulated ellipsometry combined photo-elastic modulation with electro-optic modulation[J]. Editorial Office of Optics and Precision Engineering, 2016,24(4): 690-697
李克武, 王黎明, 王志斌等. 弹光和电光级联的组合相位调制型椭偏测量术[J]. 光学精密工程, 2016,24(4): 690-697 DOI： 10.3788/OPE.20162404.0690.

LI Ke-wu, WANG Li-ming, WANG Zhi-bin etc. Phase-modulated ellipsometry combined photo-elastic modulation with electro-optic modulation[J]. Editorial Office of Optics and Precision Engineering, 2016,24(4): 690-697 DOI： 10.3788/OPE.20162404.0690.

摘要

利用弹光调制器的偏振调制优势

提出了将弹光调制器和电光调制器级联的组合相位调制型椭偏测量术。该技术采用单光路实现信号探测

通过切换电光调制器的两个工作状态

并结合数字锁相信号处理技术来完成样品反射光的p分量和s分量的幅值比

和相位差

的全范围高精度测量。对提出的新型椭偏测量原理进行了分析

搭建了相应的实验系统。完成了弹光调制器的调制电压峰峰值和相位调制幅值关系的定标

定标结果优于99.05%

然后还采用系统初始偏移值的方法对实验系统进行了校准。最后

运用该系统对石英玻璃反射样品进行了实验分析

得到的

和

的测量精度分别优于0.08°和0.81°。实验结果显示系统校准有效地消除了电光调制器和弹光调制器的剩余双折射引入的测量误差;数据采集和处理时间均在ms量级。提出的测量技术具有宽光谱测量、工作稳定、重复度高、测量速率快、成本相对较低和系统便于工业自动化集成的潜在优势。

Abstract

On the basis of the advantages of photo-elastic modulation

a phase-modulated ellipsometry combined a photo-elastic modulator with an electro-optic modulator is proposed. It uses one single detection light path to obtain the signals.By switching two work conditions of the electro-optic modulator

it takes lock-in signal processing technology to solve out the two ellipsometric parameters

amplitude ratio

and phase difference

from the p component and s component of reflection light of a simple. The principle of the new type of ellipsometry is analyzed

and a principle prototype is set up. The relationship between the peak value of modulated voltage and the phase modulation amplitude of the photo-elastic modulator is calibrated

and the calibration result is better than 99.95%. Then

an instrument offset method is used to calibrate the experimental system. Finally

a quartz glass reflective sample is analyzed by using this system

and the measurement accuracy of the

and

are respectively better than 0.08° and 0.81°. The experimental results show that the instrument offset method effectively eliminates the detection errors introduced by the residual birefringence of the photo-elastic modulator and electro-optic modulator

and the data acquisition time and signals processing time are in the order of the millisecond. In conclusion

this phase-modulated ellipsometry proposed has potential advantages of wide spectrum measurement

stable operation

high repetition rate

fast measurement speed

low cost

and is conducive to industrial automation integration.

关键词

Keywords

references

廖延彪.偏振光学[M]. 北京:科学出版社, 2003. LIAO Y B. Polarization Optics[M].Beijing:Science Press, 2003.(in Chinese)

POSTAVA K, MAZIEWSKI A, YAMAGUCHI T, et al.. Null ellipsometer with phase modulation[J]. Optics Express, 2004, 12(24):6040-6045.

ZHU J L, LIU S Y, JIANG H, et al.. Improved deep-etched multilayer grating reconstruction by considering etching anisotropy and abnormal errors in optical scatterometry[J]. Optics Letters, 2015, 40(4):471-474.

ARTEAGA O, FREUDENTHAL J, WANG B L, et al.. Mullermatrix polarimetry with four photaoelastic modilators:theroy and calibration[J]. Applied Optics, 2012, 51(28):6805-6816.

TAKESHI N, MASANORI H. Measurement of complex optical constants of highly doped Si wafer using terahertz ellipsometry[J]. Applied Physics Letters, 2001, 79(24):3917-3919.

DRUDE P.Ueber die Gesetze der Reflexion und Brechung des lichtes an der Grenze absorbirender Krystalle[J]. Annalen der Physik, 1887, 268(12):584-625.(in Germany)

李克武, 王志斌, 陈友华, 等. 基于弹光调制的高灵敏度旋光测量[J]. 物理学报, 2015, 64(18):184206. LI K W, WANG ZH B, CHEN Y H, et al..High sensitive measurement of optica rotation based on photo-elastic modualtion[J]. Acta Phys. Sin., 2015, 64(18):184206.(in Chinese)

ZENG A J, LI F Y, ZHU L L, et al.. Simultaneous measurement of retardance and fast axis angle of a quarter-wave plate using one photoelastic modulator[J]. Applied Optics, 2011, 50(22):4347-4352.

JASPERSON S N, SCHNATTERLY S E. An improved method for high reflectivity ellipsometry based on a new polarization modulation technique[J]. Review of Scientific Instruments, 1969, 40(6):761-767.

CAUREL E G, MARTINOA D, LI Y, et al.. Application of spectroscopic ellipsometry and Muller ellipsometry to optical characterization[J]. Applied Spectroscopy, 2013, 67(1):1-21.

JELLISON G E, MODINE F A.Two-modulator generalized ellipsometry:theory[J]. Applied Optics, 1997, 36(31):8190-8197.

李克武, 王志斌, 张瑞, 等. 沿光轴通光的LiNbO3的横向电光调制特性[J]. 光学精密工程, 2015, 23(5):1227-1232. LI K W, WANG ZH B, ZHANG R, et al..LiNbO3 transverse electro-optical modulation characteristics for light pass along optical axis[J]. Opt. Precision Eng., 2015, 23(5):1227-1232.(in Chinese)

De MARTINO A, GARCIA-CAUREL E, LAUDE B, et al..General methods for optimized design and calibration Muller polarimeters[J]. Thin Solid Films, 2004, 455:112-119.

LI C. Stepped polarization states:Representation and its applications to optical sensing and measurement[J]. Optics Communications, 2008, 281(8):2033-2039.

WANG M W, CHAO Y F, LEOU K C, et al.. Calibration of phase modulation amplitude of photoelastic modulator[J]. Japanese Journal of Applied Physics, 2004, 43(2):827-832.

FUJIWARA H. Spectroscopic Ellipsometry:Principles and Application[M].New York:John Wiley & Sons Ltd., 2007:147-148.

Views

357

下载量

CSCD

Alert me when the article has been cited

提交

Tools

Publicity Resources

No data

Related Author

No data

Related Institution

No data

AI问答

Address：No.3888 Dong Nanhu Road, Changchun, Jilin, China Postal code：130033
Tel：0431-86176855 Email：gxjmgc@ciomp.ac.cn
Technical support is provided by Beijing Founder electronics co., LTD 吉ICP备11002662号-17 京公网安备11010802024621
It is recommended to read the content of this site in Chrome&IE9+. Please switch to extreme mode in browser 360.
Cookies We use cookies to help provide and enhance our service and tailor content. By continuing, you agree to the use of cookies.

⁰