CHEN Li-guo, WANG Ting, LI Ya-di etc. Detection of anodic bonding joint surface for SOI piezoresistive sensor[J]. Editorial Office of Optics and Precision Engineering, 2016,24(6): 1382-1388
CHEN Li-guo, WANG Ting, LI Ya-di etc. Detection of anodic bonding joint surface for SOI piezoresistive sensor[J]. Editorial Office of Optics and Precision Engineering, 2016,24(6): 1382-1388 DOI: 10.3788/OPE.20162406.1382.
Detection of anodic bonding joint surface for SOI piezoresistive sensor
As the packaging quality of a SOI(Silicon On Insulator) piezoresistive sensor is still dependent on manual detection
this paper proposes a method to implement its automatic visual inspection. The principle of piezoresistive sensor was analyzed
and the influence of the positioning accuracy of chips and the quality of bonding joint surface on sensor performance was investigated. By taking sensor performance and quality for a research target
a method to inspect the center deviation and bonding area was proposed for joint surface detection. Through analyzing the Hough circle detection and the actual image
the method implements the positioning accuracy detection. By analysis of the effect factors on sensor quality and statistics of the bubble area
the quality of bonding joint surface was measured. The proposed visual inspection method was verified in the practical packaging processing for sensor fabrication. Experimental results indicate that the method identifies the bubble with a diameter over 6 μm and the error of glass inner hole radius is about 0.015 mm. The method proposed satisfies the requirement of piezoresistive sensor package joint surface inspection by detecting center deviation and contributes to the automated inspection of packaging quality.
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