Multi-scale representation for skin models in geometrical product specifications

Zhao-yao SHI; Hai-yang JIANG; Min ZHANG

doi:10.3788/OPE.20162407.1647

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Multi-scale representation for skin models in geometrical product specifications

Micro/Nano Technology ang Fine Mechanics | 更新时间：2020-08-13

- Multi-scale representation for skin models in geometrical product specifications
- Optics and Precision Engineering Vol. 24, Issue 7, Pages: 1647-1654(2016)
- 作者机构：
  
  北京工业大学北京市精密测控技术与仪器工程技术研究中心, 北京 100124
- 作者简介：
- 基金信息：
- DOI：10.3788/OPE.20162407.1647
  CLC： TP391.7;TH701
- Received：15 March 2016，
  
  Published：2016-07
- 稿件说明：
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Zhao-yao SHI, Hai-yang JIANG, Min ZHANG. Multi-scale representation for skin models in geometrical product specifications[J]. Optics and precision engineering, 2016, 24(7): 1647-1654.
DOI：

Zhao-yao SHI, Hai-yang JIANG, Min ZHANG. Multi-scale representation for skin models in geometrical product specifications[J]. Optics and precision engineering, 2016, 24(7): 1647-1654. DOI： 10.3788/OPE.20162407.1647.

摘要

考虑目前多数计算机辅助公差工具仅能针对具有理想几何表面的CAD模型，无法从物理几何角度真正反映制造误差，本文研究了非理想表面的多尺度表征，提出了一种能够表征产品表面及其截面轮廓宏观及微观多尺度形貌误差的非理想表面模型。首先，提出了一种利用离散小波实现形貌误差多尺度仿真的方法；其次，针对实际工件，利用离散小波对其表面及截面轮廓采样数据进行形貌误差多尺度仿真；最后，对形貌误差各尺度成分进行合成，得到具有多尺度形貌误差成分的工件三维表面及其二维截面轮廓的非理想表面模型。仿真及实验结果表明：利用提出方法可以实现具有多尺度形貌误差的非理想表面模型表征；仿真所得粗糙度

值与白光干涉仪测量所得值的平均相对误差不超过4%。得到的结果证明了提出方法的正确性和可行性，为更加全面地表征产品的非理想表面模型提供了有效途径。

Abstract

As most of the Computer Aided Tolerancing tools can only deal with the CAD models with an ideal surface and can not reflect manufacturing errors in physics and geometry

this paper explores a multi-scale representation method for skin model shapes in the Geometrical Product Specification. A discrete data modeling method was proposed for the simulation of topographic errors of surfaces and section profiles of a product in macroscopic and microcosmic scales based on new-generation geometrical product specification. Firstly

a simulation method for multi-scale surface topographic errors based on discrete wavelet was presented. Then

discrete wavelet was used to simulate multi-scale surface topography errors for sampling data of the surfaces and section profiles of a part. Finally

multi-scale surface topography errors were composed and skin models for two-dimentional profile and three-dimentional surface were acquired. The simulation and experiment results show that the proposed method represents skin models with multi-scale surface topographic errors and the average relevant error between the results of

obtained by a white-light interferometer and the proposed simulation method is less than 4%. The results verify the correctness and applicability of the proposed method

and provide a valid way for more comprehensive representation of skin model in new-generation geometrical product specification.

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