Xue-feng YAO, Ji-cheng CUI, Lu YIN, et al. Calibration devices for band range of echelle spectrometer[J]. Optics and precision engineering, 2017, 25(2): 304-311.
DOI:
Xue-feng YAO, Ji-cheng CUI, Lu YIN, et al. Calibration devices for band range of echelle spectrometer[J]. Optics and precision engineering, 2017, 25(2): 304-311. DOI: 10.3788/OPE.20172402.0304.
Calibration devices for band range of echelle spectrometer
In order to ensure full waveband range of echelle spectrometers
a set of calibration devices was designed. The principle
range and resolution of the calibration were discussed and studied. First
tolerance analysis of optical elements in the echelle spectrometer was performed
and the principle and process of auto spectrum calibration were introduced. Taking the focusing mirror as the adjusting object
the requirement of adjusting resolution was given according to the usage of the CCD image. Furthermore
a set of calibration device was designed
and the calibration resolution of the devices was calculated and experimentally verified. The results show that the azimuth calibration resolution is up to 0.006 25°
the resolution of the pitching direction is up to 0.006 25° and the resolution of the front and rear direction is up to 0.005 mm. The calibration devices can adjust the 10 pixels band offset to the normal reception range of the CCD
thus ensuring the full spectral band range of the spectrometer.
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