Reliability evaluation of recoverable degradation process under cumulative shock

Jia QI; Zhen ZHOU; Han-bin LI; De-zhong MA

doi:10.3788/OPE.20172507.1783

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Reliability evaluation of recoverable degradation process under cumulative shock

更新时间：2020-07-07

- Reliability evaluation of recoverable degradation process under cumulative shock
- Optics and Precision Engineering Vol. 25, Issue 7, Pages: 1783-1789(2017)
- 作者机构：
  
  哈尔滨理工大学测控技术与通信工程学院, 黑龙江哈尔滨 150080
- 作者简介：
- 基金信息：
- DOI：10.3788/OPE.20172507.1783
  CLC： TB114.3;TN242
- Received：18 September 2016，
  
  Accepted：10 November 2016，
  
  Published：25 July 2017
- 稿件说明：
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Jia QI, Zhen ZHOU, Han-bin LI, et al. Reliability evaluation of recoverable degradation process under cumulative shock[J]. Optics and precision engineering, 2017, 25(7): 1783-1789.
DOI：

Jia QI, Zhen ZHOU, Han-bin LI, et al. Reliability evaluation of recoverable degradation process under cumulative shock[J]. Optics and precision engineering, 2017, 25(7): 1783-1789. DOI： 10.3788/OPE.20172507.1783.

摘要

以对激光器进行可靠度评估为背景，在考虑累积冲击与自然退化同时引起产品失效的基础上，重点研究了冲击时间间隔对产品退化量的影响，建立了累积冲击作用下可恢复的退化模型。根据自然退化过程及泊松冲击更新理论，研究了累积冲击模型和累积冲击下的退化失效模型。引入条件分布，分析冲击时间间隔对退化量的影响，得出了累积泊松冲击下的可恢复退化失效模型。结合性能退化分析，给出了可恢复的退化过程的失效分布函数和可靠度函数。进行了激光器退化试验，结果表明：当激光器工作2 000 h时，利用累积冲击下可恢复的退化失效模型评估得到的可靠度为0.53，与仿真结果相符，为利用累积冲击下退化失效模型评估得到的可靠度的2.79倍。结果验证了本文提出的利用可恢复的退化模型进行可靠度评估的合理性。

Abstract

For evaluating the reliability of lasers

this paper focuses on the effects of shock time intervals on the product degradation based on the product failure from both nature degradation process and cumulative shock process. Then it establishes a recoverable degradation model in cumulative shock process. Based on natural degradation process and Poisson shock renewal theory

a cumulative shock model and a degradation failure model under cumulative shock are presented. According to the model above mentioned

the effect of shock time interval on degradation is analyzed by introducing the condition distribution and the recoverable degradation failure model under the cumulative Poisson Shock is obtained. After analyzing the performance degradation

the failture distribution function and the reliability function of the recoverable degradation process are given. A laser performance degradation experiment is performed and the results indicate that when the lasers run for 2 000 h

the reliability is 0.53 by the recoverable degradation failure model under the cumulative shock

which is more consistent with simulation result

and is 2.79 times as much as the result by the degradation failure model under cumulative shock. It verifies the rationality of evaluation by the proposed recoverable degradation failure model.

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Keywords

references

FENG J, SUN Q, JIN T D. Storage life prediction for a high-performance capacitor using multi-phase wiener degradation model[J]. Communications in Statistics-Simulation and Computation, 2012, 41(8):1317-1335.

TSAI C C, TSENG S T, BALAKRISHNAN N. Mis-specification analyses of gamma and wiener degradation processes[J].Journal of Statistical Planning and Inference, 2011, 141(12):3725-3735.

周月阁, 朱奕, 李享, 等. LED照明用驱动电源性能可靠性评估[J].电机与控制学报, 2014, 18(9):99-104.

ZHOU Y G, ZHU Y, LI X, et al.. Performance reliability assessment of LED drivers for lighting[J]. Electri c Machines and Control, 2014, 18(9):99-104. (in Chinese)

蔡忠义, 陈云翔, 项华春, 等.融合先验加速退化与外场退化信息的可靠性评估方法[J].系统工程与电子技术, 2016, 38(4):970-976.

CAI Z Y, CHEN YX, XIANG H C, et al.. Reliability assessment method with integrated prior accelerated degradation and field degradation data[J]. Systems Engineering and Electronics, 2016, 38(4):970-976. (in Chinese)

翟亚利, 张志华, 李大伟.基于冲击理论的性能可靠性评估研究[J].系统工程与电子技术, 2014, 36(10):2108-2112.

ZHAI Y L, ZHANG ZH H, LI D W. Performance reliability evaluation based on impact theory[J].Systems Engineering and Electronics, 2014, 36(10):2108-2112. (in Chinese)

WANG Y P, PHAM H. Imperfect preventive maintenance policies for two-process cumulative damage model of degradation and random shocks[J]. International Journal of System Assurance Engineering and Management, 2011, 2(1):66-77.

SKOULAKIS G. A general shock model for a reliability system[J]. Journal of Applied Probability, 2000, 37(4):925-935.

PENG H, FENG Q M, COIT D W. Reliability and maintenance modeling for systems subject to multiple dependent competing failure processes[J].ⅡE Transactions, 2010, 43(1):12-22.

JIANG L, FENG Q M, COIT D W. Reliability and maintenance modeling for dependent competing failure processes with shifting failure thresholds[J].IEEE Transactions on Reliability, 2012, 61(4):932-948.

苏春, 瞿众洲, 郝会兵.考虑相关竞争故障过程及变动阈值的可靠性评估[J].东南大学学报(英文版), 2013, 29(1):52-56.

SU C, QU Z ZH, HAO H B, Reliability assessment considering dependent competing failure process and shifting-threshold[J]. Journal of Southeast University (English Edition), 2013, 29(1):52-56. (in Chinese)

WANG Z L, HUANG H Z, LI Y F, et al.. An approach to reliability assessment under degradation and shock process[J]. IEEE Transactions on Reliability, 2011, 60(4):852-863.

刘友强, 曹银花, 李景, 等.激光加工用5kW光纤耦合半导体激光器[J].光学精密工程, 2015, 23(5):1279-1287.

LIU Y Q, CAO Y H, LI J, et al.. 5 kW fiber coupling diode laser for laser processing[J].Opt. Precision Eng., 2015, 23(5):1279-1287. (in Chinese)

全伟, 李光慧, 陈熙, 等.一体化半导体激光器的ANSYS热仿真及结构设计[J].光学精密工程, 2016, 24(5):1080-1086.

QUAN W, LI G H, CHEN X, et al.. Structural design and ANSYS thermal simulation for semiconductor laser system[J].Opt. Precision Eng., 2016, 24(5):1080-1086. (in Chinese)

RAFIEE K, FENG Q M, COIT W. Condition-based maintenance for repairable deteriorating systems subject to a generalized mixed shock model[J]. IEEE Transactions on Reliability, 2015, 4(64):1164-1174.

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