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Aberration correction technique of Offner imaging spectrometer
Grating Micro/Nano Fabrication | 更新时间:2020-07-07
    • Aberration correction technique of Offner imaging spectrometer

    • Optics and Precision Engineering   Vol. 25, Issue 12, Pages: 3001-3011(2017)
    • DOI:10.3788/OPE.20172512.3001    

      CLC: TH744.1
    • Received:26 October 2017

      Accepted:13 November 2017

      Published:25 December 2017

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  • Mei-hong ZHAO, Wen-hao LI, BAYANHESHIG, et al. Aberration correction technique of Offner imaging spectrometer[J]. Optics and precision engineering, 2017, 25(12): 3001-3011. DOI: 10.3788/OPE.20172512.3001.

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