Hai-jun ZHANG, Jia-jun CHEN, Ying-da WANG, et al. Development of wirelessly controlled atomic force microscope[J]. Optics and precision engineering, 2018, 26(9): 2205-2211.
DOI:
Hai-jun ZHANG, Jia-jun CHEN, Ying-da WANG, et al. Development of wirelessly controlled atomic force microscope[J]. Optics and precision engineering, 2018, 26(9): 2205-2211. DOI: 10.3788/OPE.20182609.2205.
Development of wirelessly controlled atomic force microscope
This paper proposes a contact mode Atomic Force Microscope (AFM) based on an embedded system and WiFi control. This AFM utilizes a portable power supply to drive the scanning/feedback circuit and an embedded system. The embedded system
which consists of a micro-computer (Raspberry Pi) and a micro AD & DA module
realizes WiFi-based communication with a laptop computer. Using this approach
a wirelessly controlled AFM is developed and experiments are performed using different samples. The results indicate that the horizontal resolution of the AFM is in nanometer order
and vertical resolution is 0.1 nm. Furthermore
the AFM can achieve a maximum scan range of 3.6 m×3.6 m. The advantages of the proposed setup include the circumvention of the need for commercial and high-voltage DC power supplies
and the obviation of a cable connection between the embedded system and the laptop computer. The system is capable of realizing AFM scanning and imaging via wireless control at approximately 100 m away. This AFM can be potentially applied in most micro/nano-technology fields. Moreover
it allows for special applications in outdoor investigations
isolated spaces
vacuum conditions
gas environments
and even interstellar exploration.
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references
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