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Development of wirelessly controlled atomic force microscope
更新时间:2020-08-13
    • Development of wirelessly controlled atomic force microscope

    • Optics and Precision Engineering   Vol. 26, Issue 9, Pages: 2205-2211(2018)
    • DOI:10.3788/OPE.20182609.2205    

      CLC: TH742
    • Received:05 February 2018

      Accepted:14 March 2018

      Published:25 September 2018

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  • Hai-jun ZHANG, Jia-jun CHEN, Ying-da WANG, et al. Development of wirelessly controlled atomic force microscope[J]. Optics and precision engineering, 2018, 26(9): 2205-2211. DOI: 10.3788/OPE.20182609.2205.

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