Spectrogram reduction for echelle grating spectrometer based on Polynomial fitting

Ji-wei ZHU; Ci SUN; Jin YANG; Ting-ting MA; Xue-qiang GUO; Jian ZHANG

doi:10.3788/OPE.20202808.1627

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Spectrogram reduction for echelle grating spectrometer based on Polynomial fitting

Modern Applied Optics | 更新时间：2020-08-14

- Spectrogram reduction for echelle grating spectrometer based on Polynomial fitting
- Optics and Precision Engineering Vol. 28, Issue 8, Pages: 1627-1633(2020)
- 作者机构：
  
  1.长春长光格瑞光电技术有限公司, 吉林长春 130102
  2.中国科学院长春光学精密机械与物理研究所, 吉林长春 130033
- 作者简介：
- 基金信息：
- DOI：10.3788/OPE.20202808.1627
  CLC： O433;TH744.1
- Received：25 December 2019，
  
  Revised：09 January 2020，
  
  Accepted：09 January 2020，
  
  Published：15 August 2020
- 稿件说明：
移动端阅览
Ji-wei ZHU, Ci SUN, Jin YANG, et al. Spectrogram reduction for echelle grating spectrometer based on Polynomial fitting[J]. Optics and precision engineering, 2020, 28(8): 1627-1633.
DOI：

Ji-wei ZHU, Ci SUN, Jin YANG, et al. Spectrogram reduction for echelle grating spectrometer based on Polynomial fitting[J]. Optics and precision engineering, 2020, 28(8): 1627-1633. DOI： 10.3788/OPE.20202808.1627.

摘要

为了基于中阶梯光栅光谱仪特殊的二维原始光谱图像实现各波长与其强度信息的一一对应，进而得到可以直接读取所需波段或波长光信号强度信息的一维光谱曲线。对其原始光谱进行分析研究，通过获得接收像面上各波长光斑位置与探测器像元的精确对应关系，实现谱图的还原处理。采用多项式拟合方法分别对中阶梯光栅光谱仪的棱镜色散方向和光栅色散方向上光斑的位置坐标进行拟合，建立起波长与像面之间的关系式，为减小光线追迹数量，同时采用级次间拟合的方式建立谱图还原模型。实验结果表明：通过该方法，可实现快速、高精度的谱图还原模型建立，模型的计算误差最大为0.023 92 mm，即谱图还原精度优于1个像元。该算法具有较强的灵活性和普适性，适用于各类中阶梯光栅光谱仪的谱图还原模型计算。

Abstract

To realize the one-to-one correspondence between each wavelength and its intensity information based on the original two-dimensional spectrogram measured by an echelle grating spectrometer

it is necessary to obtain a one-dimensional spectral curve from which the optical signal intensity as a function of wavelength can be read directly.The original spectrogram is analyzed and the accurate correspondence between the position of each wavelength spot on the receiving image surface and the detector pixel is obtained to realize the reduction processing of the spectrogram.A polynomial fitting method was used to fit the position coordinates of the wavelength spots on the dispersion direction of the prism and the grating

thus establishing the relationship between the wavelength and the image surface.Experimental results show that the polynomial fitting method can be used to establish a spectrogram reduction model rapidly and accurately

achieving spectrogram reduction accuracy of better than 1 pixel as indicated by the maximum computational error of the model (0.023 92 mm).The proposed algorithm has strong flexibility and universality

making it suitable for calculating the spectrogram reduction model for a variety of echelle grating spectrometer designs.

关键词

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references

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