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Characterization of thermal mismatch stress of micro-inertial devices based on silicon-glass bonding process
Micro/Nano Technology and Fine Mechanics | 更新时间:2020-08-14
    • Characterization of thermal mismatch stress of micro-inertial devices based on silicon-glass bonding process

    • Optics and Precision Engineering   Vol. 28, Issue 8, Pages: 1715-1724(2020)
    • DOI:10.3788/OPE.20202808.1715    

      CLC: TH703
    • Received:05 January 2020

      Revised:09 February 2020

      Accepted:09 February 2020

      Published:25 August 2020

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  • Meng-xia LIU, Qiang QIN, Xian-shan DONG, et al. Characterization of thermal mismatch stress of micro-inertial devices based on silicon-glass bonding process[J]. Optics and precision engineering, 2020, 28(8): 1715-1724. DOI: 10.3788/OPE.20202808.1715.

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