Aberration Test and Image Evaluation of Microscope Objective
光学精密工程1989年0卷第3期 页码:1-9
作者机构:
西北光学仪器厂
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DOI:
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网络出版日期:1989-06-15,
纸质出版日期:1989-06-15
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向才新, 刘钧. 显微物镜像差测定及其像质评价[J]. 光学精密工程, 1989,(3): 1-9
Xiang Caixin, Liu Jun. Aberration Test and Image Evaluation of Microscope Objective[J]. Editorial Office of Optics and Precision Engineering, 1989,(3): 1-9
Xiang Caixin, Liu Jun. Aberration Test and Image Evaluation of Microscope Objective[J]. Editorial Office of Optics and Precision Engineering, 1989,(3): 1-9DOI:
This article describes the test method of various aberrations usirg mult-ifunction interferometer for microscope objective.We have measured various kinds of objectives made at home and abroad.The wave aberration on-axis is<λ/4
but the wave aberrations at the full view field are∽λ/2 and 3λ for plane and non-plane apochromatic objective respectively.Wave aberration is a good quality criterion availablet for optical design.White light OTF is a good image guality criterion for image evaluation.