Differential Interferential Microprocessor-based Measurement System for Precision Measuring the Radius of Curvature of Long Radius Concave Optical Surfaces
Shi Xiurong, Zhang Xingye. Differential Interferential Microprocessor-based Measurement System for Precision Measuring the Radius of Curvature of Long Radius Concave Optical Surfaces[J]. Editorial Office of Optics and Precision Engineering, 1994,(6): 97-102
Shi Xiurong, Zhang Xingye. Differential Interferential Microprocessor-based Measurement System for Precision Measuring the Radius of Curvature of Long Radius Concave Optical Surfaces[J]. Editorial Office of Optics and Precision Engineering, 1994,(6): 97-102DOI:
A microprocessor-based measurement system for precision measuring the radius of curvature of very long radius concave optical surfaces in a relatively short working length is described.Its basic theory
hardware circuit design
error analysis and the detailed informationnecessary to provide for its practical application is presented.