Xue Shifu, Xu Yuxian, Li Qingxiang, Wang Xiaoye, Liu Yongsheng, Yu Shui. Investigation of Microfabrication of the Force Sensor for the Atomic Force Microscope[J]. Editorial Office of Optics and Precision Engineering, 1997,(2): 43-49
Xue Shifu, Xu Yuxian, Li Qingxiang, Wang Xiaoye, Liu Yongsheng, Yu Shui. Investigation of Microfabrication of the Force Sensor for the Atomic Force Microscope[J]. Editorial Office of Optics and Precision Engineering, 1997,(2): 43-49DOI:
the leading feature of existent micromachining technology of AFM force sensors is discussed.On the basis of those
two step corrosion with KOH solution are researched
using heavily boron doped silicon as etch stop layer.Cantilever beams with precise thickness are formed from single crystal silicon.By means of SiO 2 mask and SF 6 etching corrosive
the cantilever beam with tip is shaped by reactive ion etching once through operation.The probe has been shaped by wet corrosive and the tip radius is about 50 nm.A batch fabrication process based on micromachining technology is presented for cantilevers with integrated conical tips which are suitable for the AFM.