Wu Hanping. Research into Testing Scheme of Reliability Qualification of Complex Optoelectronic Systems[J]. Editorial Office of Optics and Precision Engineering, 1997,(5): 112-120
Wu Hanping. Research into Testing Scheme of Reliability Qualification of Complex Optoelectronic Systems[J]. Editorial Office of Optics and Precision Engineering, 1997,(5): 112-120DOI:
analyzes statistical test for exponential life hypothesis
describes fixed-time and fixed-number censored reliability testing
and fixed time testing standard scheme
discusses weighted failuress and test profile
combined environment condition.It plays directive roles of scheme design of reliability qualification test and production acceptance for complex optoelectronic systems.