ZHANG Hong-Xia, GAO Hong-Gang, WU Ming-Gen . Simulation of Even Material Removal During Eccentric Plane Polishing by a Tin Polisher[J]. Editorial Office of Optics and Precision Engineering, 1998,(2): 77-82
ZHANG Hong-Xia, GAO Hong-Gang, WU Ming-Gen . Simulation of Even Material Removal During Eccentric Plane Polishing by a Tin Polisher[J]. Editorial Office of Optics and Precision Engineering, 1998,(2): 77-82DOI:
The even material removal in the contacting area between the surfaces of polisher and the samples being finished is important for the surface contour of the samples after polishing. This paper analyzes the differences of material removal of different positions on the sample surfaces theoretically as a function of rotating ratio of sample holder and main spindle
eccentric distance and rotating velocity. The edge effect when part of the sample surfaces do not keep in contact with the polisher continuously is discussed. The simulation shows that even material removal can be achieved while the rotating ratio is 1
and every position of sample surfaces keep touching the polisher during polishing.