The Equipment for Optoelectronic Spy System for Quantitative Testing
光学精密工程1999年7卷第5期 页码:129-134
作者机构:
上海大学机械电子工程学院, 上海200072
作者简介:
基金信息:
上海市教委基金()
DOI:
中图分类号:TB92;TH703
收稿日期:1999-03-03,
修回日期:1999-07-02,
网络出版日期:1999-10-15,
纸质出版日期:1999-10-15
稿件说明:
移动端阅览
屠大维, 陶靖. 光电内窥参数检测装置[J]. 光学精密工程, 1999,(5): 129-134
TU Da-Wei, TAO Jing . The Equipment for Optoelectronic Spy System for Quantitative Testing[J]. Editorial Office of Optics and Precision Engineering, 1999,(5): 129-134
TU Da-Wei, TAO Jing . The Equipment for Optoelectronic Spy System for Quantitative Testing[J]. Editorial Office of Optics and Precision Engineering, 1999,(5): 129-134DOI:
A novel equipment for spy quantitative testing is presented in this paper. A light beam from a semiconductor laser diode converges into a line-shape by a cylindrical lens
projected onto the inner surface in a parallel direction with the pipe axis
and the information to be detected can be got from the deformed line. A special compact reflected-refracted prism group is designed for small pipes
ensuring that the line-shape light beam can be projected and then the deformed line can be imaged by a CCD camera. The image is captured into a computer by a 512×512 pixels image card for further processing
but without losing or changing any useful geometrical feature. The parameters such as pitch and depth can be measured on the monitor screen aided by the computer. The pipe diameter can also be measured by moving the stage along the pipe radius until the opposite inner surface is exactly illuminated and focused by the CCD objective lens. The experiment results show that the accuracy of ±17μm of pitch measurement
±12μm of diameter measurement has been achieved
and it has a good future to application in industry.