WANG Xiang-jun, WANG Feng . Study of Micro Mechanical Size Inspection Technology by Microscope Precision Digital Image[J]. Editorial Office of Optics and Precision Engineering, 2001,(6): 511-513
WANG Xiang-jun, WANG Feng . Study of Micro Mechanical Size Inspection Technology by Microscope Precision Digital Image[J]. Editorial Office of Optics and Precision Engineering, 2001,(6): 511-513DOI:
The microscope precision digital imaging which is obtained by means of a standard object made by means of semiconductor manufacturing technology or nanotechnology approach
the extraction of four-dimensional space error of microscope vision image system
and the real-time correction and calibration to achieve precision digital imaging are discussed. An example is given for inspection of a micro structure size of 7μm. It is an important research subject for the development and application of vision inspection technology in micro-mechanical size ranging from submicrometer to 10mm.
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references
Wilkening Dr G. Measuring methods for the determination of geometrical quantities of micro parts[A]. Proceedings of Symposium on Nano-metrology in Precision Engineering[C],1998,11(24):68-75.
Edmundson,Kenneth.Practical evaluation of sequential estimation for vision metrology[J]. ISPRS Journal of Photogrammetry and Remote Sensing, 1998,53(5):272-285.
Christopher C.Modeling errors for dimensional inspection using active vision[J]. Robotics and Computer Integrated Manufacturing, 1999,15(3):23-37.
胡晓唐. 纳米级台阶实物基准的研制和标定[A]. Proceedings of Symposium on Nano-metrology in Precision Engineering[C].HK, 1998,144-148.