SUN Ke-xu, CUI Yan-li, YI Rong-qing, JIANG Shao-en, HUANG Tian-xuan, YANG Jia-min, DING Yong-kun, CUI Ming-qi, ZHU Pei-ping, ZHAO Yi-dong, LI Gang, ZHANG Jing-he. Reflectance calibration of different material soft X-ray planar mirrors by BSRF[J]. Editorial Office of Optics and Precision Engineering, 2003,(4): 349-353
SUN Ke-xu, CUI Yan-li, YI Rong-qing, JIANG Shao-en, HUANG Tian-xuan, YANG Jia-min, DING Yong-kun, CUI Ming-qi, ZHU Pei-ping, ZHAO Yi-dong, LI Gang, ZHANG Jing-he. Reflectance calibration of different material soft X-ray planar mirrors by BSRF[J]. Editorial Office of Optics and Precision Engineering, 2003,(4): 349-353DOI:
Beijing synchrotron radiation facility(BSRF) 3W1B beam line with beam current of 40~120 mA
storage ring electron energy of 2 GeV and photon energy of 50~1 500 eV was used to conduct experiments on the reflectance calibration method. The XRD detectors of planar mirror facility were replaced by AXUV 100
increasing the rate of signal versus noise by 2 to 3 orders of magnitude
and the calibration region of 150~270 eV has been expanded to be 50~1 500 eV. The reflectivity calibration curves for 5℃
Si and Ni planar mirrors are given
and the values of experiment and calculation are compared and analyzed.
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references
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