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上海大学, 通信与信息工程学院 上海,200072
收稿日期:2003-12-14,
修回日期:2004-01-10,
网络出版日期:2004-04-15,
纸质出版日期:2004-04-15
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陈迎娟, 张之江, 张智强. CCD像素响应不均匀性的校正方法[J]. 光学精密工程, 2004,(2): 216-220
CHEN Ying-juan, ZHANG Zhi-jiang, ZHANG Zhi-qiang. Correction of CCD pixel nonuniformity[J]. Editorial Office of Optics and Precision Engineering, 2004,(2): 216-220
从理论上分析了CCD暗电流和光电响应不均匀性产生的原因
根据光电响应模型提出了CCD像素光电响应不均匀性的校正方法
给出了像素光电响应不均匀性的校正系数用以计算校正量;并针对实际情况中干扰光的影响
提出了采用变波长去除干扰方法
对校正方法进行了修正;最后通过仿真对算法进行了验证.结果表明
能量和噪声的不同对算法的影响不大
校正量是随着光信号能量分布变化的
标定过程不受信号的影响
具有自适应性.该校正方法可以有效地减小CCD像素光电响应不均匀性带来的图像噪声.
The causes for CCD dark current and photoelectric response are theoretically analyzed. An algorithm based on the photoelectric signal is proposed for correction of CCD photoelectric response nonuniformity
and a coefficient is given for calculation of electronic quantity to be corrected as well. The interference is eliminated by varying the wavelength according to the effect of actual interference light. Simulation results indicate that the algorithm proposed can be used to effectively reduce the image noise resulting from CCD pixel photoelectric response nonuniformity.
张丕壮,路宏年.面阵CCD微光像感器图像的校正[J] .兵工学报,2000,21(4):361-364.ZHANG P ZH, LU H N. The correction of image photographed by CCD image sensors[J] . Acta Armamentarii,2000,21(4):361-364.(in Chinese)
李仰军,马俊婷,郝晓剑.微光CCD相机的噪声分析与处理[J] .应用基础与工程科学学报,2001,9(2-3):277-282.LI Y J, MA J T. HAO X J. Noise analysis and process of low light-level CCD camera[J] . Journal of Basic Science and Engineering, 2001,9(2-3):277-282.
SCHULZ M,CALDWELLL.Nonuniformity correction and correctability of infFared focal plane arrays[J] .Infrared Physics&Technology,1 995,36:763-777.
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袁峰.CCD亚像素分辨技术及其在自准直中应用的研究[D] .哈尔滨:哈尔滨工业大学博士学位论文,1994.YUAN F. Study on the CCD sub-pixel resolution technique and its application to auto-collimation [D] . Harbin:Doctor Thesis of Harbin Institute of Technology, 1994.(in Chinese)
JANESICK J R, TOM E, STEWART C, et al. Scientific charge-coupled devices[J] . Optical Engineering, 1987,26(8):692-714.
吴裕斌,曹丹华.CCD成像器件的不均匀性测试[J] .华中理工大学学报,1998,26(8):58-60.WU Y B, CAO D H. Testing of nonuniformity of charge-coupled image devices[J] . J Huazhong Univ of Sci &Tech, 1998,26(8):58-60.(in Chinese)
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