X射线椭圆弯晶谱仪实验研究

肖沙里; 唐跃林; 熊先才; 钟先信; 高洁; 杨国洪

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X射线椭圆弯晶谱仪实验研究

现代光学仪器与精密机械 | 更新时间：2020-08-12

- X射线椭圆弯晶谱仪实验研究
- Experimentation of the X-ray elliptical crystal spectrograph
- 光学精密工程 2004年12卷第4期页码：415-419
- 作者机构：
  
  1. 重庆大学, 光电技术及系统教育部重点实验室重庆,400044
  2. 中国工程物理研究院, 激光聚变研究中心, 四川, 绵阳, 621900
- 作者简介：
- 基金信息：
  
  国家863-804课题资助项目(No.803-804-3)()
- DOI：
  中图分类号： O561
- 收稿日期：2004-03-05，
  
  修回日期：2004-06-15，
  
  网络出版日期：2004-08-15，
  
  纸质出版日期：2004-08-15
- 稿件说明：
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肖沙里, 唐跃林, 熊先才, 钟先信, 高洁, 杨国洪. X射线椭圆弯晶谱仪实验研究[J]. 光学精密工程, 2004,(4): 415-419

XIAO Sha-li, TANG Yue-lin, XIONG Xian-cai, ZHONG Xian-xin, GAO Jie, YANG Guo-hong . Experimentation of the X-ray elliptical crystal spectrograph[J]. Editorial Office of Optics and Precision Engineering, 2004,(4): 415-419
肖沙里, 唐跃林, 熊先才, 钟先信, 高洁, 杨国洪. X射线椭圆弯晶谱仪实验研究[J]. 光学精密工程, 2004,(4): 415-419 DOI：

XIAO Sha-li, TANG Yue-lin, XIONG Xian-cai, ZHONG Xian-xin, GAO Jie, YANG Guo-hong . Experimentation of the X-ray elliptical crystal spectrograph[J]. Editorial Office of Optics and Precision Engineering, 2004,(4): 415-419 DOI：

摘要

利用椭圆从一个焦点发射出的光线经椭圆面反射必汇聚于另一焦点的性质

设计了基于620～6200eV的X射线椭圆弯晶谱仪.文中分析了系统原理

完成了谱仪光学色散系统、探测系统及仪器的研制.采用KAP、LiF、PET、MiCa作为色散元件

其2d值在0.4～2.6nm、Bragg角为30°～67.5°

晶体尺寸为120×8×0.2mm

偏心率为0.9586

焦距1350mm

光程长1456mm

分析器基底材料用数控铣床加工.实验在上海"神光Ⅱ"号装置上实施

激光能量为150J

波长为0.35mm

真空度为3×10

-3

Pa.为达到光学对准

采用了小点光源以及精密望远镜对中.实验结果显示出金靶在0.63～0.79nm范围

其分辨力(△λ/λ)达到了1/486.谱的分辨力还与晶体特征和激光靶源尺寸有关.谱仪性能良好、使用方便、简单

具有高的收集效率和分辨能力

能够有效获取激光惯性约束聚变中激光等离子体发射光谱的丰富信息.

Abstract

Based on the theory that is ray emitted from a focus(front)of an ellipse will converge on the other focus(back)by the reflection on the elliptical surface

the Elliptical Crystal Spectrograph(ECS)in the X-ray region of 620～6200 eV was designed. The principle of the system was analyzed

and the design and manufacture were accomplished. KAP

LiF

PET and MiCa are used as dispersive elements covering Bragg angle from 30°to 67.5°. The crystal sizes are 120×8×0.2 mm with the curved analyzer substrate of eccentricity ε=0.9586

focal distance of 1350 mm

and optical path length of 1456 mm. The analyzer of the elliptical profiles was machined into a suitable substrate material using a Computer-Controlled milling machine. The Elliptical Crystal Spectrograph was experimented on Shanghai "Shenzhou Ⅱ" with laser energy of 150 J

laser wavelength of 0.35 μm

and chamber vacuum level 3×13

-3

Pa. To achieve optical alignment with a small point source

an aligned telescope was precisely fitted to the elliptical analyzer block. The result shows that spectra of Au target can be measured in 0.63～0.709 nm with a resolution of 1/486(△λ/λ). It is found that the resolution of the spectrograph depends on the rocking curve and the thickness of the crystal and the laser spot diameter. In addition

ECS is simpler and easier to use

with a higher collecting efficiency and a better resolution. It can effectively obtain abundant information of the laser-plasma emission spectra in an inertial confinement fusion.

关键词

Keywords

references

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