Based on the principle of elliptical focusing

an X-ray elliptical curved crystal analyzer whose measurement range

focal length

eccentricity and Bragg angel range are respectively 0.6~6 keV

1350 mm

0.9586 and 30°~60° was designed for investigating the laser producing plasmas. Aimed to the characteristic study of a high density plasma

a experiment was carried out with laser length of 0.35 μm

power of 1.6×10

14

W/cm

2

and the incident angel on the Ti plane of 45°. The result shows that the sensitivity of elliptical curved LiF crystal has very good detection ability

its calculated wavelength resolution is about 500~1 000 in the range of 0.2~0.35 nm. Experimental results also show that the curved crystal analyzer can be used in spatial resolution measurement for aplanatic property

its sensitivity is higher than a flat crystal. It suggests that curved LiF crystal analyzer is suitable for plasma diagnostic.