An overview of the soft X-ray polarimetry udertaken at BESSY over the last 10 years is presented. At BESSY
ten elliptical undulator beamlines are operating in the VUV and soft X-ray range
which enables the polarisation state of the synchrotron radiation to be changed from linear (horizontal or vertical) to left- or right-handed circular. It is essential that the degree of polarisation is known quantitatively
since this is a normalization quantity for many polarisation-sensitive experiments (
e.g.
MCD-spectroscopy). For a polarimetry experiment i.e. the measurement of the polarisation state of light
two optical elements are required acting as a phase retarder and a linear polariser
respectively. In the soft X-ray range
specially tailored multilayers (ML) operating in transmission and in reflection have been developed and optimized for this purpose. By matching the ML-parameters (period
thickness ratio) to an absorption edge of one of the constituent materials
a resonantly enhanced polarisation sensitivity can be achieved. Thus
ML-polarimetry is strongly connected with At-Wavelength Metrology of these polarisation optical elements
for which the instrumentation and results are presented.Examples of magneto-optical spectroscopy and polarimetry to determine properties of magnetic thin films or optically active substances are also presented (Faraday and Kerr effect