U Pietsch, O H Seeck. Beam line design for high-resolution diffraction at synchrotron radiation sources[J]. Optics and precision engineering, 2007, 15(12): 1900-1907.
U Pietsch, O H Seeck. Beam line design for high-resolution diffraction at synchrotron radiation sources[J]. Optics and precision engineering, 2007, 15(12): 1900-1907.DOI:
The general design of a high-resolution diffraction beamline at a third generation X-ray synchrotron radiation source is presented. For this
we introduce the basics of high resolution diffraction and the optical elements necessary to prepare a nearly parallel but intense X-ray beam with well-defined photon energy for high-resolution application. In particular
the function of double-crystal and four-bounced crystal monochromators is explained in terms of X-ray dynamical theory. As an example
we present the layout of the High Resolution Diffraction (HighRes) beamline at the new synchrotron radiation source PETRA III in Hamburg (Germany) which will become operational in 2009. By optimizing the optical components