掠出射微区X射线荧光分析系统的建立 及其在薄膜分析中的应用

杨君; 刘志国; 徐清; 韩东艳; 林晓燕; 杜晓光; KouichiTsuji; 丁训良

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掠出射微区X射线荧光分析系统的建立及其在薄膜分析中的应用

现代应用光学 | 更新时间：2020-08-12

- 掠出射微区X射线荧光分析系统的建立及其在薄膜分析中的应用
- Grazing exit micro X-ray spectrometer and its application to film analysis
- 光学精密工程 2009年17卷第1期页码：26-32
- 作者机构：
  
  1. 北京师范大学射线束技术与材料改性教育部重点实验室核科学与技术学院北京市辐射中心,北京 100875
  2. 中国科学院高能物理研究所,北京 100039
  3. Department of Applied Chemistry, Graduate School of Engineering, Osaka City University, Sugimoto 3-3-138, Sumiyoshi-ku Osaka 558-8585, Japan
- 作者简介：
- 基金信息：
  
  应用光学北京市重点实验室建设资助项目(000-105806)()
- DOI：
  中图分类号： O484.5;O434.19
- 收稿日期：2008-04-22，
  
  修回日期：2008-06-06，
  
  网络出版日期：2009-01-25，
  
  纸质出版日期：2009-01-25
- 稿件说明：
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杨君, 刘志国, 徐清, 韩东艳, 林晓燕, 杜晓光, KouichiTsuji, 丁训良. 掠出射微区X射线荧光分析系统的建立及其在薄膜分析中的应用[J]. 光学精密工程, 2009,17(1): 26-32

YANG Jun, LIU Zhi-guo, XU Qing, HAN Dong-yan, LIN Xiao-yan, DU Xiao-guang, Kouichi Tsuji, DING Xun-liang. Grazing exit micro X-ray spectrometer and its application to film analysis[J]. Editorial Office of Optics and Precision Engineering, 2009,17(1): 26-32
杨君, 刘志国, 徐清, 韩东艳, 林晓燕, 杜晓光, KouichiTsuji, 丁训良. 掠出射微区X射线荧光分析系统的建立及其在薄膜分析中的应用[J]. 光学精密工程, 2009,17(1): 26-32 DOI：

YANG Jun, LIU Zhi-guo, XU Qing, HAN Dong-yan, LIN Xiao-yan, DU Xiao-guang, Kouichi Tsuji, DING Xun-liang. Grazing exit micro X-ray spectrometer and its application to film analysis[J]. Editorial Office of Optics and Precision Engineering, 2009,17(1): 26-32 DOI：

摘要

建立了应用导管X光透镜的掠出射微区X射线荧光分析系统

并将该系统应用于纳米薄膜的分析。为了提高入射X射线的强度并提高系统的空间分辨率

选用焦斑为41.7 m的会聚透镜对原级X射线进行会聚

并在探测器前加上50 m的狭缝以提高掠出射角扫描的角度分辨率。为了提高工作效率

编写了该系统的自动控制软件

实现了样品的自动扫描。利用该系统对采用金属蒸汽真空电弧(MEVVA)源离子束和薄膜沉积技术制备的纳米薄膜进行了掠入射X射线荧光和二维扫描分析。实验结果表明:该系统能有效地分析纳米厚度的薄膜

通过对薄膜进行掠出射角扫描分析和表面的二维扫描分析

得到了薄膜的厚度

密度及均匀性等信息。微区分析的空间分辨率可达到41.7 m

实际空间分辨率为扫描步长50 m。系统可用于分析薄膜样品

且荧光强度高

所需时间短

获得的信息全面丰富

数据可靠。

Abstract

A Grazing Exit Micro X-ray Fluorescence (GE-MXRF) system involved with a polycapillary X-ray lens was established to analyze nanometer films. A polycapillary X-ray lens with spot size of 41.7 m was applied to focus original X-ray and a slit of 50 m was located in front of the detector to improve angle resolusion. In order to improve the working efficiency

a computer program was compiled to realize automatic control. With this system

a series of titanium and ferric layers deposited on GaAs single crystal by Metal Vapor Vacuum Arc(MEVVA) ion sources were measured. The results indicate that this system can analyze film samples effectively

and through grazing exit angle scan and surface two-dimensional scan

the density

thickness and the uniformity of film can be acquired. The spatial resolution of micro-analysis and the real spatial resolution of experiment are 41.7 m and 50 m

respectively. The conclusion is that this grazing GE-XRF system can realize the analysis of film sample automatically and quickly

also can acquire the overall information of sample and process these data effectivelly.

关键词

Keywords

references

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