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1. 北京理工大学 光电学院 北京,中国,100081
2. 首都师范大学 物理系 北京,100048
收稿日期:2008-07-15,
修回日期:2008-10-19,
网络出版日期:2009-07-25,
纸质出版日期:2009-07-25
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李艳红, 赵跃进, 张存林. 半透明材料涂层的红外检测[J]. 光学精密工程, 2009,17(7): 1502-1506
LI Yan-hong, ZHAO Yue-jin, ZHANG Cun-lin. Infrared testing for translucent material coating[J]. Editorial Office of Optics and Precision Engineering, 2009,17(7): 1502-1506
为了能快速、大面积检测不同基底材料上半透明材料涂层的厚度
研究了主动式红外热成像技术测量涂层厚度的方法。用脉冲可见光热源激励涂层试件表面
红外热像仪实时监控表面脉冲激励前后温度的变化。由于半透明的涂层材料吸收可见光能量不满足面吸收的条件
对其表面进行了喷涂黑漆处理。比较喷漆前后的对数温度时间变化曲线和微分对数温度时间变化曲线
并根据喷漆后的二阶微分曲线的峰值时间来测量涂层厚度。实验结果显示:半透明涂层材料表面处理后满足红外测量要求
厚度范围在0.8~1.7 mm的涂层
测量精度达0.09 mm
表明红外检测方法可以非接触、快速、大面积、定量地进行半透明材料涂层厚度的测量。
In order to measure the coating thicknesses on various substrate materials at a high speed and a large area
an active infrared thermographic technique was presented. A light pulse was used to heat to the surface of the coating and an infrared camera was utilized to capture the surface temperature change on real time. For a translucent coating
visible light could not be absorbed well on the surface
so a water-soluble black paint was painted on the surface of the coating. Compared with the differential ln
T
-ln
t
curves without painting the coating
the thickness of the painted coating can be measured according to the peak time of second differential ln
T
- ln
t
curves. Experiment results indicate that the translucent coating after painting satisfies infrared testing requirements
and the measurement precision is 0.09 mm for the thickness ranges of 0.8-1.7 mm. These data show that the infrared testing can be used in measurement of the coating thickness at high speeds
large areas
noncontact and quantification.
李长青. 非铁磁性金属薄层涡流测厚法[J]. 无损检测, 2005,27(9):454-456,471. LI CH Q. Measurement of the thickness of non-ferromagnetic metal sheets by eddy current testing[J]. Nondestructive Testing, 2005,27(9):454-456,471.(in Chinese)[2] 朱萍, 曹永胜. 涂层性能超声无损评价[J]. 佳木斯大学学报: 自然科学版, 2005,23(4):655-658. ZHU P, CAO Y SH. Ultrasonic nondestructive evaluation of coating performance[J]. Journal of Jiamusi University(Natural Science Edition), 2005,23(4):655-658. (in Chinese)[3] SHEPARD S M,AHMED T,RUBADEUX B A, et al.. Synthetic processing of pulsed thermographic data for inspection of turbine components[J]. Insight, 2001,43(9):587-589.[4] SHEPARD S M. Advances in pulsed thermography, Thermosense XXⅢ[J].SPIE, 2001,4360:511-515.[5] STEVEN S,JAMES L,DAVID W, et al.. Depth and spatial resolution enhancement using thermographic signal reconstruction . Proceedings of the 6th Far-East conference on NDT (FENDT'02), 2002: 279-284.[6] SHEPARD M S, HOU Y L, JAMES R L. Thermographic measurement of thermal barrier coating thickness[J]. SPIE, 2005,5782:407-410.[7] SHEPARD M S, HOU Y L, JAMES R L. Automated processing of thermographic derivatives for quality assurance[J]. Optical Engineering, 2007,46(5):051008.[8] SHEPARD S M,AHMED T,RUBADEUX B A, et al.. Synthetic process of pulsed thermographic data for inspection of turbine components[J]. Insight, 2001,43(9):587-589.[9] 李艳红, 金万平, 杨党纲,等. 蜂窝结构的红外热波无损检测[J]. 红外与激光工程, 2006,35(4):45-48. LI Y H, JIN W P, YANG D G,et al.. Thermal wave nondestructive testing of honeycomb structure[J]. Infrared and Laser Engineering, 2006,35(1):45-48. (in Chinese)[10] 李艳红,赵跃进,冯立春,等. 基于脉冲位相的红外热波无损检测法测量缺陷深度[J]. 光学 精密工程, 2008,16(1):55-58. LI Y H, ZHAO Y J, FENG L CH,et al.. Measurement of defect depth by infrared thermal wave nondestructive evaluation based on pulsed phase[J]. Opt. Precision Eng., 2008,16(1):55-58. (in Chinese)
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