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电子信息系统复杂电磁环境效应国家重点实验室,河南 洛阳 471003
[ "周旋风(1988-),男,重庆万州人,博士,助理研究员,2016年于国防科技大学获得博士学位,主要从事光电对抗技术方面的研究。E-mail:zhouxuanfeng2012@163.com" ]
收稿日期:2020-12-31,
修回日期:2021-02-23,
纸质出版日期:2021-06-15
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周旋风,张德锋,王彦斌等.激光辐照行间转移型CCD的串扰效应[J].光学精密工程,2021,29(06):1225-1233.
ZHOU Xuan-feng,ZHANG De-feng,WANG Yan-bin,et al.Crosstalk effects of IT-CCD irradiated by laser[J].Optics and Precision Engineering,2021,29(06):1225-1233.
周旋风,张德锋,王彦斌等.激光辐照行间转移型CCD的串扰效应[J].光学精密工程,2021,29(06):1225-1233. DOI: 10.37188/OPE.20212906.1225.
ZHOU Xuan-feng,ZHANG De-feng,WANG Yan-bin,et al.Crosstalk effects of IT-CCD irradiated by laser[J].Optics and Precision Engineering,2021,29(06):1225-1233. DOI: 10.37188/OPE.20212906.1225.
在采用一束激光辐照电荷耦合器件(Charged Coupled Device, CCD)图像传感器时,串扰效应是最重要的干扰之一。本文采用532 nm激光对一个行间转移型CCD进行辐照实验,观测到了一系列串扰现象,计算CCD的饱和阈值为0.32 mW/cm
2
。根据行间转移型CCD的工作原理和驱动脉冲时序,将串扰效应分为积分周期内的溢出和读出转移时的溢出两个过程,并据此开展了串扰效应图像的仿真研究。首先基于高斯光束传输变换规律对探测靶面的激光能量分布进行了仿真,然后根据光电转换效应对光生电荷分布进行了仿真,对串扰效应的两个溢出过程进行仿真得到了串扰电荷分布,最后对电压检测和灰度量化过程进行仿真得到了串扰图像。统计计算得到仿真相对误差均小于40%,说明仿真结果与实验结果吻合得很好。
Crosstalk effect is one of the most important jamming phenomena that occurs when a CCD imaging sensor is irradiated by a laser beam. An interline transfer CCD was experimentally irradiated by a 532 nm laser beam. A series of crosstalk phenomena were observed, and the saturation threshold of CCD was calculated to be 0.32 mW/cm
2
. According to the working principle and driving pulse time sequence of an interline transfer CCD, we divided the crosstalk phenomenon into two overflowing processes: overflowing during the integral period and overflowing at the readout transfer moment. Crosstalk images were simulated based on this theory. First, laser intensity distributions on the detector surface were simulated based on the transmission transformation law of Gaussian beam. Then, photo-induced charge distribution was simulated by photoelectric conversion. It was followed by crosstalk charge distribution simulation based on the two overflowing processes. Finally, crosstalk images were obtained by simulating voltage detection and gray quantitative processes. The relative error of simulation was less than 40%, which shows that the simulation results are in good agreement with experimental results.
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