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上海大学 机械电子工程与自动化学院 上海,200072
收稿日期:2010-07-19,
修回日期:2010-11-06,
网络出版日期:2011-03-22,
纸质出版日期:2011-03-22
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王志明, 龚振邦, 魏光普. 薄膜与小组件太阳电池特性参数测试系统的研制[J]. 光学精密工程, 2011,19(3): 628-634
WANG Zhi-ming, GONG Zhen-bang, WEI Guang-pu. Test system for photoelectric characteristic parameters of thin film and module solar cells[J]. Editorial Office of Optics and Precision Engineering, 2011,19(3): 628-634
王志明, 龚振邦, 魏光普. 薄膜与小组件太阳电池特性参数测试系统的研制[J]. 光学精密工程, 2011,19(3): 628-634 DOI: 10.3788/OPE.20111903.0628.
WANG Zhi-ming, GONG Zhen-bang, WEI Guang-pu. Test system for photoelectric characteristic parameters of thin film and module solar cells[J]. Editorial Office of Optics and Precision Engineering, 2011,19(3): 628-634 DOI: 10.3788/OPE.20111903.0628.
为了快速、精确地测量薄膜与小组件太阳电池的光电特性参数
建立了太阳电池测试系统
研究了测试系统的控制模式与测试精度。选取DSP芯片TMS320LF2407为主控芯片
采用模块化与总线结构的设计思路
使系统具有较快的响应性与扩展性。运用高精度运算放大器等电子元件
研制了程控电子负载
可精确测量太阳电池的短路电流与开路电压。采用多路电子开关、多路继电器与精密电阻组合设计
实现了太阳电池光电参数的分挡测试
使系统可适用于多规格、多品种薄膜与小组件太阳电池的特性参数测量。实验结果表明:系统能在短路电流3 mA~5.6 A
开路电压0.5~20 V内实现自动分档测试
开路电压的最大相对误差<0.4%
短路电流的最大相对误差<0.8%
很好地满足了薄膜与小组件太阳电池精确测量的需要。
A test system was established to test the photoelectric characteristic parameters of thin film and module solar cells rapidly and accurately
and the control mode and test accuracy of the test system were studied. By taking the DSP chip TMS320LF2407 as the main chip
the modular and bus structures as the design idea
the obtained system show a faster response and a good scalability. With the applications of high precision operational amplifiers and other electronic components
a program-controlled electronic load was developed
so that the short-circuit currents and open-circuit voltages of the solar cells can be measured accurately. Furthermore
the multi-channel electronic switches
relays and precision resistors were combined to realize an adaptive test
and the photoelectric characteristic parameters of different thin film and module solar cells were measured accurately. The experiment results show that the test system can complete the adaptive test while the short-circuit current is in the range of 3 mA to 5.6 A and the open-circuit voltage is from 0 V to 50 V. The relative error is less than 0.6% for the measurement of open-circuit voltage and 0.8% for the measurement of short-circuit current
respectively. This result satisfies the demands of solar cell test.
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