利用晶体多重衍射进行同步辐射光子能量标定

陶世兴; 牛晶; 陈鸣之; 刘科; 王玉; 汪启胜; 孙波; 黄胜; 唐琳; 何建华

doi:10.3788/OPE.20111905.0977

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利用晶体多重衍射进行同步辐射光子能量标定

现代应用光学 | 更新时间：2020-08-12

- 利用晶体多重衍射进行同步辐射光子能量标定
- Calibration of synchrotron radiation photon energy using crystal multiple diffraction
- 光学精密工程 2011年19卷第5期页码：977-982
- 作者机构：
  
  1. 中国科学院上海应用物理研究所上海,201800
  2. 中国科学院研究生院北京,100039
- 作者简介：
- 基金信息：
  
  上海市自然科学基金资助项目(No.08JC1422500)()
- DOI：10.3788/OPE.20111905.0977
  中图分类号： O72;O436.1
- 收稿日期：2010-10-12，
  
  修回日期：2010-11-17，
  
  网络出版日期：2011-05-26，
  
  纸质出版日期：2011-05-26
- 稿件说明：
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陶世兴, 牛晶, 陈鸣之, 刘科, 王玉, 汪启胜, 孙波, 黄胜, 唐琳, 何建华. 利用晶体多重衍射进行同步辐射光子能量标定[J]. 光学精密工程, 2011,19(5): 977-982

TAO Shi-xing, NIU Jing, CHEN Ming-zhi, LIU Ke, WANG Yu, WANG Qi-sheng, SUN Bo, HUANG Sheng, TANG Lin, HE Jian-hua. Calibration of synchrotron radiation photon energy using crystal multiple diffraction[J]. Editorial Office of Optics and Precision Engineering, 2011,19(5): 977-982
陶世兴, 牛晶, 陈鸣之, 刘科, 王玉, 汪启胜, 孙波, 黄胜, 唐琳, 何建华. 利用晶体多重衍射进行同步辐射光子能量标定[J]. 光学精密工程, 2011,19(5): 977-982 DOI： 10.3788/OPE.20111905.0977.

TAO Shi-xing, NIU Jing, CHEN Ming-zhi, LIU Ke, WANG Yu, WANG Qi-sheng, SUN Bo, HUANG Sheng, TANG Lin, HE Jian-hua. Calibration of synchrotron radiation photon energy using crystal multiple diffraction[J]. Editorial Office of Optics and Precision Engineering, 2011,19(5): 977-982 DOI： 10.3788/OPE.20111905.0977.

摘要

介绍了多重衍射的基本原理

包括多重衍射的指标化、衍射光强度的计算和入射光方向的确定

并根据晶体多重衍射现象提出了入射X光能量的标定方法。从理论上讲

使用该标定方法在角度扫描精度为1时

光子能量标定精度可达到1 eV。在上海光源14B衍射光束线上对提出的标定方法进行了实验验证

在10 keV处用Si(111)为主衍射收集了180

扫描衍射谱

对其中的衍射谷进行了指标化

并根据指标化的结果计算得到标定能量为10.06 keV。该实验结果与理论结果相符

验证了在角度扫描精度满足实验要求时

通过该标定方法可进行高精度的光子能量标定。

Abstract

This paper describes the basic principle of multiple diffraction

including diffraction indexing and its intensity calculation

as well as the direction determination of the incident X-ray that meets the Bragg condition for two specific crystal planes. It proposes a X-ray energy calibration method based on the crystal multiple diffraction. In theory

this calibration method can reach a very high precision of 1 eV when the scanning step is 1. To verify the feasibility of this method

a test is performed on the 14B diffraction beam line of Shanghai source

and the 180

scanning diffraction pattern for the silicon(111) is collected at 10 keV. All the possible diffraction planes are set up and the glitch is indexed according to the angle difference of them. After indexing of the glitch

the calibrated energy of 10.06 keV is obtained. The experimental results are consistent with the theoretical results well

which proves that the calibration method can achieve a high precise calibration for photon energies when the angle scanning accuracy meets the needs of experiments.

关键词

Keywords

references

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