准连续输出大功率半导体激光器的结温测试

田振华; 孙成林; 曹军胜; 郜峰利; 宁永强; 王立军

doi:10.3788/OPE.20111906.1244

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准连续输出大功率半导体激光器的结温测试

现代应用光学 | 更新时间：2020-08-12

- 准连续输出大功率半导体激光器的结温测试
- Junction temperature measurement of high power diode lasers
- 光学精密工程 2011年19卷第6期页码：1244-1249
- 作者机构：
  
  1. 中国科学院长春光学精密机械与物理研究所,吉林长春,中国,130033
  2. 中国科学院研究生院北京,100039
  3. 吉林大学电子科学与工程学院,吉林长春,130023
  4. 吉林大学物理学院,吉林长春,130023
- 作者简介：
- 基金信息：
  
  国家自然科学基金重点资助项目(No.90923037)();吉林大学科学前沿与交叉学科创新项目(No.200903089)()
- DOI：10.3788/OPE.20111906.1244
  中图分类号： TN248.4
- 收稿日期：2010-03-16，
  
  修回日期：2010-06-28，
  
  网络出版日期：2011-06-25，
  
  纸质出版日期：2011-06-25
- 稿件说明：
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田振华, 孙成林, 曹军胜, 郜峰利, 宁永强, 王立军. 准连续输出大功率半导体激光器的结温测试[J]. 光学精密工程, 2011,19(6): 1244-1249

TIAN Zhen-hua, SUN Cheng-lin, CAO Jun-sheng, GAO Feng-li, NING Yong-qiang, WANG Li-jun. Junction temperature measurement of high power diode lasers[J]. Editorial Office of Optics and Precision Engineering, 2011,19(6): 1244-1249
田振华, 孙成林, 曹军胜, 郜峰利, 宁永强, 王立军. 准连续输出大功率半导体激光器的结温测试[J]. 光学精密工程, 2011,19(6): 1244-1249 DOI： 10.3788/OPE.20111906.1244.

TIAN Zhen-hua, SUN Cheng-lin, CAO Jun-sheng, GAO Feng-li, NING Yong-qiang, WANG Li-jun. Junction temperature measurement of high power diode lasers[J]. Editorial Office of Optics and Precision Engineering, 2011,19(6): 1244-1249 DOI： 10.3788/OPE.20111906.1244.

摘要

基于大功率半导体激光器的热传导模型提出了一种测量准连续输出大功率半导体激光器结温的方法。实验通过测量980 nm大功率半导体激光器在不同电脉冲宽度(5~200 s)下的时域光谱和输出特性d/dT=0.3 nm/℃来确定它的结温;同时

根据热传导模型推导出准连续工作条件下结温的近似解析表达式来验证测量得到激光器的结温。结果表明

实验测量结果和通过解析表达式理论计算结果之间符合得很好。所提出的解析表达式可准确预测大功率半导体激光器在准连续工作条件下的结温而无需测量时域光谱

是一种简便快速的预测方法。

Abstract

A measuring method for the junction temperature of Quasi-Continuous Wave(QCW) and high power semiconductor laser diodes was put forward based on the thermal model of a high power semiconductor laser.In experiments

the different spectra and output powers of a 980 nm high power semiconductor laser diode under different pulse widths(5~200 s) were measured and the junction temperature was obtained by the relationship of d/dT=0.3 nm/℃. Furthermore

an approximate analytical equation was deduced on the basis of the thermal model to calculate the junction temperature. The experiment shows that the measured results are in a good agreement with the analytical results.In conclusion

the equation is a convenient method for predicting the junction temperature without measuring the spectrum.

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references

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