红外探测器件在低温背景下的探测率测试

王世涛; 张伟; 王强

doi:10.3788/OPE.20122003.0484

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红外探测器件在低温背景下的探测率测试

现代应用光学 | 更新时间：2020-08-12

- 红外探测器件在低温背景下的探测率测试
- Measurement for detectivity of infrared detectors in low temperature background
- 光学精密工程 2012年20卷第3期页码：484-491
- 作者机构：
  
  哈尔滨工业大学空间光学工程研究中心, 哈尔滨黑龙江 150001
- 作者简介：
- 基金信息：
  
  航天科技集团第五研究院CAST基金资助项目()
- DOI：10.3788/OPE.20122003.0484
  中图分类号： TN215;TP732+.2
- 收稿日期：2012-02-03，
  
  修回日期：2012-02-10，
  
  网络出版日期：2012-03-22，
  
  纸质出版日期：2012-03-22
- 稿件说明：
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王世涛, 张伟, 王强. 红外探测器件在低温背景下的探测率测试[J]. 光学精密工程, 2012,(3): 484-491

WANG Shi-tao, ZHANG Wei, WANG Qiang. Measurement for detectivity of infrared detectors in low temperature background[J]. Editorial Office of Optics and Precision Engineering, 2012,(3): 484-491
王世涛, 张伟, 王强. 红外探测器件在低温背景下的探测率测试[J]. 光学精密工程, 2012,(3): 484-491 DOI： 10.3788/OPE.20122003.0484.

WANG Shi-tao, ZHANG Wei, WANG Qiang. Measurement for detectivity of infrared detectors in low temperature background[J]. Editorial Office of Optics and Precision Engineering, 2012,(3): 484-491 DOI： 10.3788/OPE.20122003.0484.

摘要

建立了红外探测器件低温背景探测率测试系统

实验研究了红外探测器件在低温背景下的探测特性

用于支持红外探测低温光学系统的合理设计。首先

介绍并分析了红外探测系统的噪声和响应特性

建立了低温光学系统设计与红外探测器件在低温背景下探测性能之间的关系;在热真空环境下搭建了基于变温面源黑体的低温背景探测率测试系统。然后

针对某红外器件在低温背景下的探测率进行了实验测量。最后

通过计算得到了低温背景下极限积分时间及探测特性相对于常温背景下的一般变化规律。实验结果表明:低温背景下极限积分时间及探测率均比常温背景下提高近20倍

提出的测试技术可为低温光学系统的指标设计提供依据与参考。

Abstract

To support the correct design of cryogenic optical systems

a measuring system for the detectivity of infrared detectors in low temperature background was established and applied to some infrared detectors for testing their detection characteristics. First

the theoretical analysis for noise and response characteristics of an infrared acquisition system was introduced

and the relationship between the design of a low temperature optical system and the detectivity of infrared detector in the low temperature background was established. Then

a measurement system of detectivity in the low temperature background based on thermal vacuum enviroment was proposed

and experimental research on some infrared detectors in the low temperature background was accomplished. Finally

the variation regularities of limiting integration time and detectivity in low temperature compared with those in normal temperature case were discussed as well. Experimental results indicate that both of the integration time and detecitivity in the low temperature background are 20 times that in normal temperature background. The regularity derived can satisfy the requirments of system index design of low temperature optical systems.

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references

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