CCD辐射响应函数矩阵的建立与应用

任建伟; 张艳琪; 叶钊; 全先荣

doi:10.3788/OPE.20122005.0957

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CCD辐射响应函数矩阵的建立与应用

现代应用光学 | 更新时间：2020-08-12

- CCD辐射响应函数矩阵的建立与应用
- Establishment and application of CCD radiation response function matrix
- 光学精密工程 2012年20卷第5期页码：957-962
- 作者机构：
  
  1. 中国科学院长春光学精密机械与物理研究所,吉林长春,中国,130033
  2. 中国科学院研究生院北京,100039
- 作者简介：
- 基金信息：
  
  国家863高技术研究发展计划资助项目(No.863-2-5-1-13B)()
- DOI：10.3788/OPE.20122005.0957
  中图分类号： TN386.5
- 收稿日期：2011-09-13，
  
  修回日期：2011-11-18，
  
  网络出版日期：2012-05-10，
  
  纸质出版日期：2012-05-10
- 稿件说明：
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任建伟, 张艳琪, 叶钊, 全先荣. CCD辐射响应函数矩阵的建立与应用[J]. 光学精密工程, 2012,20(5): 957-962

REN Jian-wei, ZHANG Yan-qi, YE Zhao, QUAN Xian-rong. Establishment and application of CCD radiation response function matrix[J]. Editorial Office of Optics and Precision Engineering, 2012,20(5): 957-962
任建伟, 张艳琪, 叶钊, 全先荣. CCD辐射响应函数矩阵的建立与应用[J]. 光学精密工程, 2012,20(5): 957-962 DOI： 10.3788/OPE.20122005.0957.

REN Jian-wei, ZHANG Yan-qi, YE Zhao, QUAN Xian-rong. Establishment and application of CCD radiation response function matrix[J]. Editorial Office of Optics and Precision Engineering, 2012,20(5): 957-962 DOI： 10.3788/OPE.20122005.0957.

摘要

为了能采用物理意义明确的函数式来表述大格式电荷耦合器件(CCD)的性能参数

直观地实现对面阵CCD辐射性能的评价

本文提出利用"辐射响应函数矩阵"概念来表述CCD每个像元的辐射性能参量。首先

分析了该矩阵各元素的物理意义

提出了对CCD每个像元的绝对辐射响应度、响应非线性度、暗噪声、信噪比以及非均匀性的描述方法。其次

对面阵CCD KAI-16000进行辐射性能检测

并利用回归分析计算出各像元的响应系数。最后

以测试结果为例

讨论和描述该矩阵的应用和结果。实验结果表明:该CCD近似成线性响应

通过矩阵函数可以计算出CCD非均匀性为3.1%

暗噪声为3.84。此方法实用

满足对大格式CCD直观表述的要求。

Abstract

To describe the parameters of a big format Charge Coupled Device (CCD) by a function with definit physical meaning and to evaluate its radiation response performance directly

a concept of "radiation response function matrix" was proposed to describe the radiation response parameters of each pixel of the CCD. Firstly

by analyzing the physical concept of each element

some parameters such as absolute radiate response

nonlinearity

dark noise

Signal-to-Noise Ratio (SNR) and the non-uniformity of each pixel of the CCD were characterized by the matrix. Then

response characteristic coefficient of each pixel was obtained using the model of multiple regression analysis by a test on the area CCD KAI-16000. Finally

by taking the result for an example

application of this matrix was discussed. Experimental results show that the response of this CCD is linear

and its non-uniformity is 3.1%

dark noise is 3.84. These results demonstrate that the method is feasible and practical

and it can satisfy the requirement of the description of a big format CCD.

关键词

Keywords

references

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