大型空间反射镜发射率测量及误差分析

孔林; 王栋; 金光; 李宗轩

doi:10.3788/OPE.20122009.2014

您当前的位置：

首页 >

文章列表页 >

大型空间反射镜发射率测量及误差分析

微纳技术与精密机械 | 更新时间：2020-08-12

- 大型空间反射镜发射率测量及误差分析
- Emissivity measurement and error analysis of large space reflector
- 光学精密工程 2012年20卷第9期页码：2014-2020
- 作者机构：
  
  1. 中国科学院长春光学精密机械与物理研究所,吉林长春,中国,130033
  2. 中国科学院研究生院北京,100039
- 作者简介：
- 基金信息：
  
  国家863高技术研究发展计划资助项目(No.2010AA702103)()
- DOI：10.3788/OPE.20122009.2014
  中图分类号： V447;TH703
- 收稿日期：2012-04-05，
  
  修回日期：2012-06-24，
  
  纸质出版日期：2012-09-10
- 稿件说明：
移动端阅览
孔林, 王栋, 金光, 李宗轩. 大型空间反射镜发射率测量及误差分析[J]. 光学精密工程, 2012,20(9): 2014-2020

Kong Lin, Wang Dong, Jin Guang, Li Zong-xuan. Emissivity measurement and error analysis of large space reflector[J]. Editorial Office of Optics and Precision Engineering, 2012,20(9): 2014-2020
孔林, 王栋, 金光, 李宗轩. 大型空间反射镜发射率测量及误差分析[J]. 光学精密工程, 2012,20(9): 2014-2020 DOI： 10.3788/OPE.20122009.2014.

Kong Lin, Wang Dong, Jin Guang, Li Zong-xuan. Emissivity measurement and error analysis of large space reflector[J]. Editorial Office of Optics and Precision Engineering, 2012,20(9): 2014-2020 DOI： 10.3788/OPE.20122009.2014.

摘要

为了准确测定空间相机主镜毛坯件的表面发射率以便定量分析相机热控效果

本文在分析热像仪测温原理的基础上

利用现有测量条件

提出一种利用两种已知发射率材料作为参考的发射率测量方法。根据测量试验

得到主镜表面发射率为0.565。为定量反映各因素对测量精度的影响

对测量公式进行了误差分析。分析结果表明

与被测件表面发射率接近的材料的热像仪测温误差及发射率标称误差对测量精度有较大影响

同时得到本次试验因热像仪测温误差及参考材料发射率标称误差带来的测量误差为0.028。最后

结合相机热平衡试验的数据对测量结果进行了验证

结果表明测量得到的主反射镜的发射率基本反映了热平衡试验的主镜表面状态

证明本文的方法对主反射镜发射率的测量是适用有效的。

Abstract

To determine the emissivity of the primary mirror in a space camera and to analyze the thermal control effort for a subsystem

a method for measuring emissivity by using two kinds of materials with known emissivity as references was proposed based on the analysis of temperature measurement principle of a thermal imager. According to the emissivity measurement experiment

the primary mirror emissivity was calculated to be 0.565. To determine the influence of different measuring factors on the measurement accuracy

an error analysis was carried out. Analysis results prove that when the materials to be measured have almost the same emissivity with the objects

the temperature measurement errors of the thermal imager and emissivity standard error of the material will have greater impacts on the measurement accuracy. The measurement error caused by temperature measurement error and emissivity error is 0.028 in the proposed experiment. Finally

the thermal model of the camera was modified by using a thermal equilibrium test

the results demonstrate that the emissivity measured by proposed method reflects the actual state of the primary mirror

and the method is useful and feasibility for measuring the emissivity of primary mirrors.

关键词

Keywords

references

OKAMOTO Y, INAGAKI T, SEKIYA M. Surface temperature measurement using infrared radiometer ( 1st report, radiosity coefficient and radiation temperature) [J]. Trans Jpn Soc Mech Eng Ser B, 1993 (59): 232-237.[2] 杨立,寇蔚,刘慧开,等. 热像仪测量物体表面辐射率及误差分析[J]. 激光与红外,2002,32(1):43-45. YANG L, KOU W, LIU H K, et al.. Surface emissivity measurement and error analysis using infrared thermograph [J]. Laser & Infrared, 2002, 32 (1):43-45. (in Chinese)[3] 杨立. 红外热像仪测温计算与误差分析[J]. 红外技术,1999,21(4): 20-24. YANG L. Calculation and error analysis of temperature measurement using thermal imager [J]. Infrared Technology, 1999, 21(4): 20-24. (in Chinese)[4] 侯成刚,张广明,等. 用红外热成像技术精确测定物体发射率[J]. 红外与毫米波学报,1997,16(3): 193-198. HOU CH G, ZHANG G M, et al.. Accurate measurement of object emissivity using infrared imaging technique [J]. Infrared Millim. Waves, 1997, 16(3): 193-198. (in Chinese)[5] 曹义,程海峰,郑文伟,等. 基于红外热像仪的涂层波段发射率测量[J]. 红外技术, 2007,29(6): 316-319. CAO Y, CHENG H F, ZHENG W W, et al.. Measure wideband emissivity of coatings with thermal imager [J]. Infrared Technology, 2007, 29(6): 316-319.(in Chinese)[6] 徐军,陈益松,甄慧英,等. 基于红外热像技术的织物红外发射率测量方法[J]. 纺织学报,2009,30(9):41-44. XU J, CHEN Y S, ZHEN H Y, et al.. Fabric IR emissivity as measured by IR thermal-imaging technology[J]. Journal of Textile Research. 2009, 30(9):41-44.(in Chinese)[7] 黄龙祥,沈湘衡,宋江涛. 基于热像仪的物体波段发射率的测量[J]. 激光与红外, 2009,39(2):159-161. HUANG L X, SHEN X H, SONG J T. Measure target wideband emissivity with thermal imager[J]. Laser & Infrared,2009, 39 (2): 159-161. ( in Chinese)[8] 吴国忠,张海玲,齐晗兵,等. 采用参考发射率法提高红外点温仪测温精度研究[J]. 计量学报, 2007,28 (3A): 165 -168. WU G ZH, ZHANG H L, QI H B, et al.. The improvement of measurement precision of infrared nod temperature instrument with reference emissivity [J]. Acta Metrological Sinica, 2007, 28 (3A): 165 -168.(in Chinese)[9] 英克鲁佩勒.传热和传质基本原理[M].北京:化学工业出版社,2007, 4. INCROPERA. Fundamentals of Heat and Mass Transfer [M]. Beijing: Chemical Industry Press, 2007, 4. ( in Chinese)[10] 李云红,孙晓刚,原桂彬. 红外热像仪精确测温技术[J]. 光学精密工程, 2007, 15(9): 1336-1341. LI Y H, SUN X G, YUAN G B. Accurate measuring temperature with infrared thermal imager[J]. Opt. precision Eng., 2007, 15(9):1336-1341. (in Chinese)[11] BARRY J R. On the validity and techniques of temperature and emissivity measurements. SPIE, 1988, 1: 934.[12] ROBERT P M. Emissivity measurement and temperature correction accuracy [J]. SPIE, 1999, 3700: 393-401.

浏览量

625

下载量

CSCD

文章被引用时，请邮件提醒。

提交

工具集

关联资源

空间相机透镜调焦机构的设计与测试

空间相机调焦机构误差分析

空间相机直线调焦机构的设计

红外热像仪精确测温技术

空间相机偏流调整旋转轴系的设计与精度分析