用于红外晶体双折射测量的单1/4波片法

唐玉国; 何淼; 崔继承; 巴音贺希格; 陈少杰

doi:10.3788/OPE.20122010.2176

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用于红外晶体双折射测量的单1/4波片法

现代应用光学 | 更新时间：2020-08-12

- 用于红外晶体双折射测量的单1/4波片法
- Senamont based measuring method for birefringence of infrared crystal
- 光学精密工程 2012年20卷第10期页码：2176-2183
- 作者机构：
  
  1. 中国科学院长春光学精密机械与物理研究所,吉林长春,中国,130033
  2. 中国科学院大学北京,中国,100049
- 作者简介：
- 基金信息：
  
  国家创新方法工作计划专项资助项目(No.2008IM040700)();吉林省科技支撑计划资助项目(No.20106011)()
- DOI：10.3788/OPE.20122010.2176
  中图分类号： O734.2;O436.3
- 收稿日期：2012-03-05，
  
  修回日期：2012-05-18，
  
  纸质出版日期：2012-10-10
- 稿件说明：
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唐玉国, 何淼, 崔继承, 巴音贺希格, 陈少杰. 用于红外晶体双折射测量的单1/4波片法[J]. 光学精密工程, 2012,20(10): 2176-2183

TANG Yu-guo, HE Miao, CUI Ji-cheng, Bayanheshig, CHEN Shao-jie. Senamont based measuring method for birefringence of infrared crystal[J]. Editorial Office of Optics and Precision Engineering, 2012,20(10): 2176-2183
唐玉国, 何淼, 崔继承, 巴音贺希格, 陈少杰. 用于红外晶体双折射测量的单1/4波片法[J]. 光学精密工程, 2012,20(10): 2176-2183 DOI： 10.3788/OPE.20122010.2176.

TANG Yu-guo, HE Miao, CUI Ji-cheng, Bayanheshig, CHEN Shao-jie. Senamont based measuring method for birefringence of infrared crystal[J]. Editorial Office of Optics and Precision Engineering, 2012,20(10): 2176-2183 DOI： 10.3788/OPE.20122010.2176.

摘要

提出了一种基于单1/4波片法的测量方法以实现红外波段光学晶体双折射光程差的精确测量。采用厚度差小于一个周期厚度的两个样品进行比对

有效克服了单1/4波片法测量厚度的限制。依照此原理研制了测试波长为3.39

m的晶体双折射测试设备。应用琼斯矩阵理论

推导了存在主要误差因素时的信号光强解析表达式

并由此分析了起偏器方位角误差、1/4波片定位精度、样品方位角偏差、检偏器旋转定位精度对测量结果的影响

综合评价了本测量方法的精度。实验结果表明

应用研制的设备实测标准1/4波片的双折射光程差误差为0.003 76

相对误差为0.44%

满足系统要求。得到的结果表明

采用基于单1/4波片法的新测量方法能够有效、精确测得红外晶体的双折射光程差。

Abstract

A method based on the Senamont method was proposed to precisely measure the birefringence of an infrared crystal. Two specimens with the Optical Pass Differences (OPD) within 1 wavelength caused by the birefringence were compared to overcome the measured OPD limit of Senamont method and to extend the method to the infrared band. According to the new method

a set of apparatus for measuring the birefringence of infrared crystal was developed. Moreover

by applying the Jones matrix

the expressions of signal intensity with various error sources were proposed to analyze precisely the influences of the error sources including the azimuth error of a polarizer

the orientation error of the quarter wave plate

the azimuth error of the specimen and the orientation error of the analyzer

then the measuring precision of this method was evaluated. The experiment results indicate that the measured OPD error for a standard quarter wave plate is 0.00376

and the relative error is 0.44%

which is within the precision and satisfies the system targets.

关键词

Keywords

references

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